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Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Welland, M. E., Miles, M. J. & Gimzewski, J. K. Probe Microscopy: Editorial. Probe Microscopy 1, 1–1 (1997).
Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).
Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).
Joachim, C., Gimzewski, J. K. & Tang, H. Physical principles of the single-C 60 transistor effect. Physical Review B 58, 16407 (1998).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).
Gimzewski, J. K. Photons and Local Probes 189–208 (Springer Netherlands, 1995).
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).
Gimzewski, J. K., Affrossman, S., Gibson, M. T., Watson, L. M. & Fabian, D. J. Oxidation of scandium by oxygen and water studied by XPS. Surface Science 80, 298–305 (1979).
Jung, T., Schlittler, R., Gimzewski, J. K. & Himpsel, F. J. One-dimensional metal structures at decorated steps. Applied Physics A 61, 467–474 (1995).
Naranjo, B., Gimzewski, J. K. & Putterman, S. E. T. H. Observation of nuclear fusion driven by a pyroelectric crystal. Nature 434, 1115–1117 (2005).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science Letters 247, A213 (1990).
Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Berger, R., Gerber, C., Lang, H. P. & Gimzewski, J. K. Micromechanics: A toolbox for femtoscale science:"Towards a laboratory on a tip". Microelectronic engineering 35, 373–379 (1997).
Fabian, J. - H. et al. Micro Total Analysis Systems' 9 117–120 (Springer Netherlands, 1998).
Berger, R. et al. Micromechanical thermogravimetry. Chemical Physics Letters 294, 363–369 (1998).
Scandella, L. et al. Micromechanical Thermal Gravimetry Performed on one Single Zeolite Crystal. Helvetica Physica Acta 71, 3–4 (1998).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Reihl, B., Coombs, J. H. & Gimzewski, J. K. Local inverse photoemission with the scanning tunneling microscope. Surface Science 211, 156–164 (1989).
Gimzewski, J. K. et al. Investigations of the surface of the amorphous alloy Fe< sub> 80 B< sub> 20 by STM, XPS and AES. Journal of non-crystalline solids 116, 253–261 (1990).