ldnqjmnmecsiorg call submissions participation date 2008 friday workshop impact process variability design test icm munich germany friday march 14 2008 httpwwwdateconferencecomconference2008progprogdetailphpprogidw2 abstract submission deadline march 1 2008 early registration deadline february 20 2008 workshop description integrated circuit technology continues shrink mainstream semiconductors starting produced 45nm technology node transistors wires measure less 100 atoms across discrepancies lithography wavelengths circuit feature sizes increase lower power supply levels increasing operating speeds significantly reduce noise margins increase variations process device design parameters consequently increasingly difficult control fabrication process precisely enough maintain uniformity inherent randomness materials used fabrication nanoscopic scales means performance increasingly variable dietodie also within individual die process variation solved improving manufacturing tolerances variability must reduced new device technology managed design order scaling continue withindie performance variation also imposes new challenges test methods test hardware must embedded design detect errors dynamically isolate confine faults reconfigure system work around faults using spare hardware recover errors fly become increasingly important devices experience parametric degradation time requiring runtime reconfiguration workshop provide forum researchers industry academia latest results presented ideas exchanged working different approaches dealing variability scope workshop covers aspects process variation transistor level includes new devices replace cmos order reduce variability modelling transistor devices atomic scales variation understood viewpoint fabrication technology new techniques cad tools predicting compensating effect variability processes interest circuit system level tools design methods must aware variation without adding extra complexity renders design intractable process variationaware test reliability methods together various design techniques allow circuits systems adapt variability also particular relevance bringing together researchers different areas expertise workshop aims encourage collaborative research tackles problems process variation several levels simultaneously program participation workshop includes seven interesting invited talks however significant part workshop based around poster presentations maximise opportunities discussion interaction amongst participants two onehour sessions workshop poster presentations format posters a0 portrait title brief abstract poster sent gert jervan inmoppldttuee mladen berekovic nngoqprftidaingtubsde pete sedcole xxflkbffvuhimperialacuk participation requires registration registration fee discounted registration available date08 web site february 20 2008 fullfee registration also possible onsite munich germany information see httpwwwdateconferencecomconference2008progprogdetailphpprogidw2 please feel free forward anyone believe may interested gert jervan inmoppldttuee mladen berekovic nngoqprftidaingtubsde pete sedcole xxflkbffvuhimperialacuk fri 08 aug 2008 142403 0100 uai date 2008 friday workshop impact process variability design test call submissions