Reflections collected 120453 9946 [Rint = 0.0534, Rsigma = Independent reflections 0.0277] Data/restraints/parameters 9946/0/192 Goodness-of-fit on F2 1.305 R indexes [I>=2σ (I)] R1 = 0.0695, wR2 = 0.1237 Final R indexes [all data] R1 = 0.0790, wR2 = 0.1274 Largest diff. peak/hole / e Å-3 2.79/-3.74 References (1) Bruker AXS Inc.: Madison, WI, 2012. APEX II; (2) Bruker AXS Inc.: Madison, WI, 2008. SADABS; (3) Sheldrick, G. M. 2008, (Pt 1), 112. Acta Crystallogr. A. 64 (4) Farrugia, L. J. 1999, (4), 837. J. Appl. Crystallogr. 32 (5) Dolomanov, O. V.; Bourhis, L. J.; Gildea, R. J.; Howard, J. A. K.; Puschmann, H. J. Appl. 2009, (2), 339. Crystallogr. 42 (6) Spek, A. L. 2003, (1), 7. J. Appl. Crystallogr. 36
Reflections collected 120453 Independent reflections 9946 [Rint = 0.0534, Rsigma = 0.0277] Data/restraints/parameters 9946/0/192 Goodness-of-fit on F2 1.305 R indexes [I>=2σ (I)] R1 = 0.0695, wR2 = 0.1237 Final R indexes [all data] R1 = 0.0790, wR2 = 0.1274 Largest diff. peak/hole / e Å-3 2.79/-3.74 References (1) APEX II; Bruker AXS Inc.: Madison, WI, 2012. (2) SADABS; Bruker AXS Inc.: Madison, WI, 2008. (3) Sheldrick, G. M. Acta Crystallogr. A. 2008, 64 (Pt 1), 112. (4) Farrugia, L. J. J. Appl. Crystallogr. 1999, 32 (4), 837. (5) Dolomanov, O. V.; Bourhis, L. J.; Gildea, R. J.; Howard, J. A. K.; Puschmann, H. J. Appl. Crystallogr. 2009, 42 (2), 339. (6) Spek, A. L. J. Appl. Crystallogr. 2003, 36 (1), 7.
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