[] Abrasive PMMA + C / Cu NP Sealed HEPA filtered SiC paper: SEM of PC from • • Test (Taber 10% Cu NP: NM CNT glove box, 150 LPM P1200: large no of ELPI/stage2: • Linear (PMMA-Cu) air flow rate. ultrafine # PC-CNT: NP found, no Tester) Polycarb. + P120: fewer # and CNT. • 3% CNT: coarser. TEM: from NAS: (PC-CNT) PC-CNT: no CNT PMMA-Cu: Cu detected by EDX; brush: Cu in µm particles. SiC: Cu nearly detached. [] Abrasive + CNT (0, C / CNT Enclosure chamber Four modes found Only few particles from Authors indicate that TEM Test (Taber) 0.1, 1 wt.%) NM surrounding abrasion in each case (Table abr. wheel (EDX). Matrix images prove wheel. 1). CNT cause particles, CNT protruding, CNT are 70nm->90nm shift free individual CNT (!) released. in mode1. [] + Wet CNF-Composite C / CNF Without controls Substantial Matrix fragments CNF quantified by • • suppl. cutting using NM amounts of Free CNF elemental carbon (EC) • Inside ventilated • diamond nanoscale CNF CNF agglomerates & reading and identified by • booth blade table (from EC) and bundles TEM of collected particles. saw 300-10,000nm Dry surface CNF-Composite C / CNF LEV: Measurement at Nanoscale and Matrix fragments High concentration of • grinding NM edge of LEV 300-10,000nm Free CNF ultra-fine particles, only • few CNF. Tabletop belt CNF-Composite C / CNF LEV: Measurement at No nanoscale, but Matrix fragments CNF not detected in BZ • sanding NM edge of LEV inlet. 300-10,000nm Clusters of spherical with LEV operational • present carbon particles Hand CNF-Composite C / CNF Vent on No nanoscale, but Matrix fragments TEM shows evidence of • • sanding and CNF NM present Free CNF CNF, regardless of • Vent off • inside spray Buckypaper ventilation conditions. booth laminate
[] Abrasive Test (Taber Linear Tester) • PMMA + 10% Cu NP: (PMMA-Cu) • Polycarb. + 3% CNT: (PC-CNT) C / NM • Cu NP • CNT Sealed HEPA filtered glove box, 150 LPM air flow rate. SiC paper: P1200: large no of ultrafine # P120: fewer # and coarser. SEM of PC from ELPI/stage2: PC-CNT: NP found, no CNT. TEM: from NAS: PC-CNT: no CNT PMMA-Cu: Cu detected by EDX; brush: Cu in µm particles. SiC: Cu nearly detached. [] Abrasive Test (Taber) + CNT (0, 0.1, 1 wt.%) C / NM CNT Enclosure chamber surrounding abrasion wheel. Four modes found in each case (Table 1). CNT cause 70nm->90nm shift in mode1. Only few particles from abr. wheel (EDX). Matrix particles, CNT protruding, free individual CNT (!) Authors indicate that TEM images prove CNT are released. [] + suppl. Wet cutting using diamond blade table saw CNF-Composite C / NM CNF • Without controls • Inside ventilated booth Substantial amounts of nanoscale CNF (from EC) and 300-10,000nm • Matrix fragments • Free CNF • CNF agglomerates & bundles CNF quantified by elemental carbon (EC) reading and identified by TEM of collected particles. Dry surface grinding CNF-Composite C / NM CNF LEV: Measurement at edge of LEV Nanoscale and 300-10,000nm • Matrix fragments • Free CNF High concentration of ultra-fine particles, only few CNF. Tabletop belt sanding CNF-Composite C / NM CNF LEV: Measurement at edge of LEV inlet. No nanoscale, but 300-10,000nm present • Matrix fragments • Clusters of spherical carbon particles CNF not detected in BZ with LEV operational Hand sanding inside spray booth CNF-Composite and CNF Buckypaper laminate C / NM CNF • Vent on • Vent off No nanoscale, but present • Matrix fragments • Free CNF TEM shows evidence of CNF, regardless of ventilation conditions.
investigating-emissions-composites-maching-processes.docx