JEOL 7000 Rough Syllabus Instructor Johnny Goodwin Office: 205-348-1576 Mobile: 239-222-4341 Office Bevill 1019 E-mail jgoodwin@caf.ua.edu Office Hours - M-F Text: Download, print and read the Power point presentation Basic Operation and Exploring the JEOL Program, available on our website. Bring to class for notes. Description: Basic vacuum and microscopy techniques. Sample prep and coating. Goals: Session 1: Explanation of microscope and beam formation. Introduction to microscope software. Focus and Stigmate. Load and unload procedures, instruction only. Session 2: Focus and Stigmation. Students must be able to focus and stigmata properly before moving forward with the training. Session 3: Explanation of working distance. Theoretical and practical application of accelerating voltage. Load and Unload procedures, instruction only. Session 4: Focus and Stigmation review. Theoretical and practical application of spot size/ probe current. Load and unload procedures, instruction only. Session 5: Load and unload practical. Practice using student’s samples. Review concepts as needed. Requirements: Read and Print PowerPoint Presentation Basic Operation and Exploring the JEOL Program. Resources: Guide to electron microcopy available from instructor. Evaluation: Ability to load and unload samples, choose a correct acceleration voltage and spot size. Maintain proper working distance while producing a properly focused and stigmated image.
JEOL 7000 Rough Syllabus Instructor Johnny Goodwin Office: 205-348-1576 Mobile: 239-222-4341 Office Bevill 1019 E-mail jgoodwin@caf.ua.edu Office Hours - M-F Text: Download, print and read the Power point presentation Basic Operation and Exploring the JEOL Program, available on our website. Bring to class for notes. Description: Basic vacuum and microscopy techniques. Sample prep and coating. Goals: Session 1: Explanation of microscope and beam formation. Introduction to microscope software. Focus and Stigmate. Load and unload procedures, instruction only. Session 2: Focus and Stigmation. Students must be able to focus and stigmata properly before moving forward with the training. Session 3: Explanation of working distance. Theoretical and practical application of accelerating voltage. Load and Unload procedures, instruction only. Session 4: Focus and Stigmation review. Theoretical and practical application of spot size/ probe current. Load and unload procedures, instruction only. Session 5: Load and unload practical. Practice using student’s samples. Review concepts as needed. Requirements: Read and Print PowerPoint Presentation Basic Operation and Exploring the JEOL Program. Resources: Guide to electron microcopy available from instructor. Evaluation: Ability to load and unload samples, choose a correct acceleration voltage and spot size. Maintain proper working distance while producing a properly focused and stigmated image.
JEOL-7000-Syllabus.docx