PAPERS PUBLISHED: S. NAME OF TITLE OF THE PAPER CONFERRENCE/ DATE OF THE SAFF JOURALS ETC. MEMBER WHERE PUBLISHED Structural Analysis and Journal of Electronic 2015 Dr. Mohd 1. Dielectric Properties of Materials, Vol. 44, No. Ikram 1.798 HoFe1-xNixO3¬ 4, (2015) [I.F= ]. (0.0≤x≤0.5). and Journal of Alloy and 2015 “Structural, Magnetic Electronic Structure Studies Compound 628 of PrFe1-xMnxO3 (x=0.0, (2015) 0.1, 0.3, 0.5)Thin Films [I.F=2.999]. Grown on Si (100) An investigation of Adv.Mat. Lett. 6(7), 2015 Electrical, Magnetic and 1.99]. (2015) [I.F= Optical,Properties of (x= 0.0, 0.3, 0.5 and 0.7) system” Electrical and magnetic RSC Adv., 5, 69075 2015 properties of the pulsed laser (2015) [I.F= 3.840]. deposited Ca doped LaMnO3 thin films Si(100) and their electronic structures” of Mn doping on RSC Adv., Effect 5, 2015 Structural, Morphological 93867(2015) [I.F= and Dielectric properties 3.840]. of EuFeO3ceramics” Correlative exploration of Adv.Mat. Lett. 6(12), 2015 Structural, Optical and 1081-1097 (2015) [I.F= electronic properties of 1.99]. colossal Dielectric Ni doped Sm orthoferrites” Effect of 200 MeV Ag12+ accepted in Journal of 2016 ion irradiations on Materials Science: structural, Materials in Electronics morphological and magnetic (2016) DOI properties of (x = 0.0, 0.1, 0.3 1.569]. and 0.5) thin films grown on Si (100)
PAPERS PUBLISHED: S. NAME OF THE SAFF MEMBER TITLE OF THE PAPER CONFERRENCE/ JOURALS ETC. WHERE PUBLISHED DATE OF 1. Dr. Mohd Ikram Structural Analysis and Dielectric Properties of HoFe1-xNixO3¬ (0.0≤x≤0.5). Journal of Electronic Materials, Vol. 44, No. 4, (2015) [I.F= 1.798 ]. 2015 “Structural, Magnetic and Electronic Structure Studies of PrFe1-xMnxO3 (x=0.0, 0.1, 0.3, 0.5)Thin Films Grown on Si (100) Journal of Alloy and Compound 628 (2015) [I.F=2.999]. 2015 An investigation of Electrical, Magnetic and Optical,Properties of (x= 0.0, 0.3, 0.5 and 0.7) system” Adv.Mat. Lett. 6(7), (2015) [I.F= 1.99]. 2015 Electrical and magnetic properties of the pulsed laser deposited Ca doped LaMnO3 thin films Si(100) and their electronic structures” RSC Adv., 5, 69075 (2015) [I.F= 3.840]. 2015 Effect of Mn doping on Structural, Morphological and Dielectric properties of EuFeO3ceramics” RSC Adv., 5, 93867(2015) [I.F= 3.840]. 2015 Correlative exploration of Structural, Optical and electronic properties of colossal Dielectric Ni doped Sm orthoferrites” Adv.Mat. Lett. 6(12), 1081-1097 (2015) [I.F= 1.99]. 2015 Effect of 200 MeV Ag12+ ion irradiations on structural, morphological and magnetic properties of (x = 0.0, 0.1, 0.3 and 0.5) thin films grown on Si (100) accepted in Journal of Materials Science: Materials in Electronics (2016) DOI 1.569]. 2016