(71) Casalini, S.; Shehu, A.; Destri, S.; Porzio, W.; Pasini, M. C.; Vignali, F.; Borgatti, F.; Albonetti, C.; Leonardi, F.; Biscarini, F. Organic Field-Effect Transistors as New Paradigm for Large-Area Molecular Junctions. 2012, 789–795. Org. Electron. 13, (72) R.; San Paulo, A. Attractive and Repulsive Tip-Sample Interaction Regimes in Garcıa, Tapping-Mode Atomic Force Microscopy. 1999, 4961–4967. Phys. Rev. B 60, (73) Herruzo, E. T.; Garcia, R. Frequency Response of an Atomic Force Microscope in Liquids and Air: Magnetic Acoustic Excitation. 2007, 143113. versus Appl. Phys. Lett. 91, (74) Butt, H.-J.; Jaschke, M. Calculation of Thermal Noise in Atomic Force Microscopy. 1995, 1–7. Nanotechnology 6,
(71) Casalini, S.; Shehu, A.; Destri, S.; Porzio, W.; Pasini, M. C.; Vignali, F.; Borgatti, F.; Albonetti, C.; Leonardi, F.; Biscarini, F. Organic Field-Effect Transistors as New Paradigm for Large-Area Molecular Junctions. Org. Electron. 2012, 13, 789–795. (72) Garcıa, R.; San Paulo, A. Attractive and Repulsive Tip-Sample Interaction Regimes in Tapping-Mode Atomic Force Microscopy. Phys. Rev. B 1999, 60, 4961–4967. (73) Herruzo, E. T.; Garcia, R. Frequency Response of an Atomic Force Microscope in Liquids and Air: Magnetic versus Acoustic Excitation. Appl. Phys. Lett. 2007, 91, 143113. (74) Butt, H.-J.; Jaschke, M. Calculation of Thermal Noise in Atomic Force Microscopy. Nanotechnology 1995, 6, 1–7.