<s>[INST] A high purity test fixture is connected on JTAG IEEE 1149.1 compliant device. The JTAG requirement is to shift 16 data bits at valid clock speed of 20 kHz to 80 kHz. The device is programmed to sample the data on rising edge of clock signal. The scope probe is connected on TDI pin with reference to GND. How will you proceed to capture the data on an oscilloscope captured how the data is applied to the device?[/INST]