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  Choosing a new microscope is a major investment, and you want to make sure you’re getting the best solution for your sample and application needs. While datasheets can give you some insight into the instrument performance, available software and professional support we provide, it is often hard to judge what is really going to work well for your own unique samples and challenges. That’s why we believe that the best way to decide if a solution is right for you is with a live demonstration on your own sample.
  Our NanoPort, located in Tokyo, Japan and opened in 2016, is an electron microscopy (EM) center of excellence where you can test out our latest products and develop and advance your knowledge and skills with support from our applications team. The Nanoport team performs live demonstrations and training for researchers and engineers, as well as supporting workshops and other events.
  Shinagawa Seaside West Tower 1F
  Shinagawa-ku, Tokyo 140-0002,Japan
  The Tokyo NanoPort has over 10 professionals with many years of hands-on experiences at customer sites and most of them hold a PhD or MSc in their area of expertise.
  We invite you to bring your own sample to the NanoPort Customer Innovation Center to personally experience the difference our instrumentation, software, and knowledge can make for your challenging analysis and characterization needs.
  See the Thermo Fisher Scientific difference – the expertise and analytical techniques available at the Tokyo NanoPort include:
  Workshops: A combination of discussion and practical work focusing on a particular subject/industry, where we encourage attendees to share their knowledge and experience.
  In-house courses: Hands-on in-person training that helps customers build their electron microscopy application skillset.
  Remote training: Tailored training delivered remotely straight from our NanoPort’s top experts to you, whether you are in your lab or at any remote location.
  Please contact us to learn more about the cost of these events and how to schedule them.
  Thermo Scientific Helios Hydra DualBeam (plasma FIB) Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation. For Materials Science, Semiconductors
  Thermo Scientific Helios 5 UX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductors
  Thermo Scientific Talos F200X TEM TEM microscope for high resolution TEM and STEM with accurate chemical quantification. For Materials Science, Semiconductors
  Thermo Scientific Nexsa G2 Surface Analysis System Nexsa G2 Surface Analysis System X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities. For Materials Science
  Thermo Scientific ELITE System Lock-In IR Thermography system for localization of defects in semiconductor devices. For Semiconductors
  On-site training for new instrumentation can be time-consuming, and the training needs of each facility and lab can vary greatly. To address these difficulties, we have developed a new Remote Application Training program to bring our best application scientists and training material to you, no matter where you are in the world.
  Request a demo or training