A BIST procedure is proposed for testing and fault tolerance of molecular electronics-based nanofabrics. The nanofabrics are assumed to include up to 10/sup 10/ gates: this requires new test strategies that can efficiently test and diagnose the nanofabric in a reasonable time. Our BIST procedure utilizes nanofabric's components as test pattern generator and response analyzer. The proposed technique tests the components in parallel with a low number of test configurations reducing the test time significantly. Due to high defect density of nanofabrics, a diagnostic procedure needs to be done to achieve a high recovery. A defect database is created to be used by compilers during configuring the nanofabric to avoid defective components. This results in a reliable system constructed using unreliable components.
['Mohammad Tehranipoor']
Defect tolerance for molecular electronics-based nanofabrics using built-in self-test procedure