The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution.
['Janusz Rajski', 'Jerzy Tyszer']
Diagnosis of scan cells in BIST environment