A deterministic software-based self-testing methodology for processor cores is introduced that efficiently tests the processor datapath modules without any modification of the processor structure. It provides a guaranteed high fault coverage without repetitive fault simulation experiments which is necessary in pseudorandom software-based processor self-testing approaches. Test generation and output analysis are performed by utilizing the processor functional modules like accumulators (arithmetic part of ALU) and shifters (if they exist) through processor instructions. No extra hardware is required and there is no performance degradation.
['Antonis M. Paschalis', 'Dimitris Gizopoulos', 'Nektarios Kranitis', 'Mihalis Psarakis', 'Yervant Zorian']
Deterministic software-based self-testing of embedded processor cores