This paper describes a variance reduction technique for supply ramp test method. The technique makes use of multiple current measurements from a single device under similar test conditions to generate robust test limits with lower variance. The necessary conditions that guarantee variance reduction under these circumstances have also been described. We demonstrate that variance reduction has an additional benefit of 10% to the overall coverage of the test method.
['S. Krishnan', 'R. Jonker', 'L. van de Logt']
Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives