In this paper we study the testability of circuits derived from binary decision diagrams (BDDs) under the bridging fault model. It is shown that testability can be formulated in terms of symbolic BDD operations. By this, test pattern generation can be carried out in polynomial time. A technique to improve testability is presented. Experimental results show that a complete classification can be carried out very efficiently.
['Junhao Shi', 'Görschwin Fey', 'Rolf Drechsler']
Bridging fault testability of BDD circuits