Pick-place of single nanowires inside scanning electron microscopes (SEM) is useful for prototyping functional devices and characterizing nanowires's properties. Nanowire pick-place has been typically performed via teleoperation, which is time-consuming and highly skill-dependent. This paper presents an automated approach to the pick-place of single nanowires. Through SEM visual detection and vision-based motion control, the system automatically transferred individual silicon nanowires from their growth substrate to a microelectromechanical systems (MEMS) device that characterized the nanowires's electromechanical properties. The performance of the nanorobotic pick-up and placement procedures was experimentally quantified.
['Xutao Ye', 'Yong Zhang', 'Changhai Ru', 'Jun Luo', 'Shaorong Xie', 'Yu Sun']
Automated Pick-Place of Silicon Nanowires