We introduce the concept of test vector chains, which allows us to obtain new test vectors from existing ones through single-bit changes without any test generation effort. We demonstrate that a test set  T   0  has a significant number of test vector chains that are effective in increasing the numbers of detections of target faults, i.e., faults targeted during the generation of  T   0 , as well as untargeted faults, i.e., faults that were not targeted during the generation of  T   0 .
['Irith Pomeranz', 'Sudhakar M. Reddy']
Test vector chains for increased targeted and untargeted fault coverage