This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.
['Biswajit Bhowmik', 'Jatindra Kumar Deka', 'Santosh Biswas']
An on-line test solution for addressing interconnect shorts in on-chip networks