Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.
['Hsiang-Huang Wu', 'Jih-Nung Lee', 'Ming-Cheng Chiang', 'Po-Wei Liu', 'Chi-Feng Wu']
A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design