Historically many ways of expressing memory tests have been used; varying from special notations to the use of general purpose programming languages. A notation, originally introduced for march tests in 1990, has been adopted and extended by many researchers. This paper extends that notation, in a systematic way, to a memory test language which allows march tests, pseudo march tests (such as GALPAT) and tests involving topological neighborhoods (to cover pattern sensitive faults) to be expressed in a unified way. The syntax and semantics facilitate the specification of memory tests in a compact way and can be processed using standard tools such as LEX and YACC.
['Ad J. van de Goor', 'Aad Offerman', 'Ivo Schanstra']
Towards a uniform notation for memory tests