A Transition Controllable Noise Source (TCNS) generates substrate noises with controlled transitions in size, interstage delay, and direction. The noises are measured in a 100 ps 100 /spl mu/V resolution by a linear substrate voltage detector that uses a front-end PMOS source follower probing substrate potential and a back-end latch comparator for sampling/digitizing the source follower output. A 0.4 /spl mu/m CMOS test chip demonstrates the effectiveness of these circuits in performing advanced research on substrate noise.
['Makoto Nagata', 'T. Ohmoto', 'Jin Nagai', 'Takashi Morie', 'Atsushi Iwata']
Test circuits for substrate noise evaluation in CMOS digital ICs