The continuing divergence of processor and memory speeds has led to the increasing reliance on larger caches which have become major consumers of area and power in embedded processors. Concurrently, intra-die and inter-die process variation at future technology nodes will cause defect-free yield to drop sharply unless mitigated. This paper focuses on an architectural technique to configure cache designs to be resilient to memory cell failures brought on by the effects of process variation. Profile-driven re-mapping of memory lines to cache lines is proposed to tolerate failures while minimizing degradation in average memory access time (AMAT) and thereby significantly boosting performance-based die yield beyond that which can be achieved with current techniques. For example, with 50% of the number of cache lines faulty, the performance drop quantified by increase in AMAT using our technique is 12.5% compared to 60% increase in AMAT using existing techniques.
['Subramanian Ramaswamy', 'Sudhakar Yalamanchili']
Customizable Fault Tolerant Caches for Embedded Processors