Multiported high-performance on-die memories occupy significantly more die area than a comparable single-port memory. Among various multiport memory topologies, the 1-read (R), 1-write (W) 8-transistor (T) Static Random Access Memory (SRAM) with a decoupled read port allows separate optimization of the read and write ports when organized without interleaved logical columns. This enables a lower minimum operating voltage (   $V_{\mathrm{ min}}$   ) compared with other dual-port SRAMs that require ports optimized for read stability and write operations. However, the 1R1W 8T SRAM often employs large signal, hierarchical bitline sensing to achieve high performance due to the nondifferential read bitline. This large-signal read architecture necessitates frequently placed local bitline sensing circuits, degrading the array bit density. In this paper, we present two sense amplifier (SA) techniques for small-signal pseudo-differential sensing to facilitate 256 bits per bitline achieving an 8T SRAM array density of 5.6 Mb/mm   $^{2}\vphantom {^{\int ^\int }}$    in 14 nm FinFET CMOS. The first design employs a charge sharing SA scheme to generate a reference voltage (   $V_{\mathrm{ REF}}$   ) by leveraging the capacitance of otherwise unused metal tracks over the bitcell column. The second design utilizes an asymmetric SA in which the read bitline precharged to    $V_{\mathrm{ CC}}$    in the unselected sector acts as a reference voltage and the active bitline side is intentionally upsized to skew the SA. High volume measurement results demonstrate 560 mV    $V_{\min }$    at 400 MHz/−10 °C and reaches 2.21 GHz at 1 V supply.
['Jaydeep P. Kulkarni', 'John Keane', 'Kyung-Hoae Koo', 'Satyanand Nalam', 'Zheng Guo', 'Eric Karl', 'K. Zhang']
5.6 Mb/mm $^{2}$ 1R1W 8T SRAM Arrays Operating Down to 560 mV Utilizing Small-Signal Sensing With Charge Shared Bitline and Asymmetric Sense Amplifier in 14 nm FinFET CMOS Technology