It is shown that the common belief that any optimized, i.e., nonredundant, circuit is easier to test than its nonoptimized counterpart is not fully justified. It is demonstrated by example that a redundant circuit may be more suitable for random testing than its optimized counterpart. A rule which specifies when redundancy is likely to enhance random testability of a two-level AND-OR gate network is formulated. >
['Andrzej Krasniewski', 'Alexander Albicki']
Random testability of redundant circuits