The aim of this paper is the presentation of a new methodology for fast test pattern generation for difficult faults. A BDD-based algorithm is applied as back-end of a standard ATPG (e.g. SOCRATES, FAN, PODEM) thus providing a solution to their inefficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approach on a number of benchmark circuits.
['Cristiana Bolchini', 'Franco Fummi', 'Ralph A Gemelli', 'Fabio Salice']
A BDD based algorithm for detecting difficult faults