In this paper we will show how high level test synthesis can achieve higher testability for BIST oriented test methodologies. Our results show considering testability during high-level synthesis, better testability can be obtained when compared to DFT at low level.
['Kowen Lai', 'Christos A. Papachristou', 'Mikhail Baklashov']
BIST testability enhancement using high level test synthesis for behavioral and structural designs