Automated test data generation technology is a hot researching area in automated software test. Some kinds of new concepts such as base node, control node, definition node and definition related control node set are proposed, and in addition, a solution to obtain the definition related control node set is designed, on the basis of combining both the method of linear approximation and DUC expression, an innovative algorithm based on reversed binary tree for automated test data generation is proposed, which can automatically find out all of the feasible paths in the program from the source node to the base node, and can automatically generate the test data for each founded feasible path also. Thereafter, the automated test data generation problem in the software tests has been solved finally. Algorithm analyses show that the newly proposed algorithm has the good features such as simple coding and better efficiency.
['Junyi Li', 'Jiaguang Sun']
Automated Test Data Generation Algorithm Based on Reversed Binary Tree