We propose a comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits. A time-division multiplexing (TDM) comparator scheme was proposed as an effective signature analyzer for on-chip analog response compaction and pass/fail decision with minimum hardware overhead. By applying this scheme to the oscillation-based test, the oscillation frequency can be measured indirectly as well as the oscillation amplitude to increase the fault coverage. The experimental results demonstrate that the proposed scheme can significantly reduce test time of the oscillation-based test with higher fault coverage.
['Jeongjin Roh', 'Jacob A. Abraham']
A comprehensive TDM comparator scheme for effective analysis of oscillation-based test