An elegant example of using CNT tips to optimal advantage was demonstrated by Watanabe et al.25 These researchers leveraged the high lateral compliance of CNT tips by incorporating the bending behavior into a unique imaging mode that could measure vertical sidewalls with a straight and vertically mounted CNT tip. This innovative work helped set the stage for a more recent investigation of CNT snap-in behavior on vertical sidewalls using a second-generation CD-AFM.26 In the future, similarly creative ways of using the behavior of very small tips to advantage will likely become increasingly important at the frontier of CD-AFM metrology.