Our fabrication of CNT tips consists of two separate steps: mounting of the CNT onto the AFM mother tip using manipulation in an SEM and the subsequent CNT modification using FIB. The procedure is shown in Fig. 2. CNT tips fabricated by manipulation in SEM are usually misoriented as made, so they are aligned in the FIB system through the ion beam bending (IBB) process. Thus processed, a CNT tip acts as a normal straight CNT tip, and the CNT itself maintains its elasticity as can be checked with a bending test in SEM.34 Using this process, we can change a “bad” tip to a “good” tip and a “good” tip to an “optimized” tip. The subsequent modification of CNT tips for CD-AFM starts with this straight form. It is noteworthy, however, that although IBB improves the tip geometry, ion bombardment is believed to introduce defects in nanotube structures, so minimization of dose is recommended. It is equally important to have a good nanotube tip prior to the IBB process. IBB-aligned CNT tips are then bent further to make the J-tip by irradiating the CNT end not masked by the cantilever, since the exposed part aligns opposite to the FIB direction whereas the unexposed part remains as is. Alternatively, FIB aligned CNT tips may be formed into B-tips by depositing platinum at the end using IBID. The organic platinum molecule adsorbed on the CNT is dissociated, and the platinum atoms form a ball at the top end of the nanotube while minimizing the surface energy. As the ball increases in size, it masks the CNT below, like an umbrella, so that the total increase in the shaft thickness is not significant.