The MoS2 nanosheets used in this study were purchased from Sigma-Aldrich (99.995%, Sigma-Aldrich, St. Louis, USA). According to the method reported previously , field emission scanning electron microscopy combined with energy dispersive spectrometry (FE-SEM, Hitachi S-4800) was utilized to determine the surface morphology and relative abundance of chemical elements of the MoS2 samples. In addition, the MoS2 samples were analyzed using a HR800 Raman Microscope (Horiba Jobin Yvon, France) and focalized using a 40 × objective with an excitation wavelength of 514 nm, adjusting the exposure time to acquire the correct spectrum.