Since our first experiments in this area, there have been improvements in CNT tip fabrication methods, both in general and specifically in terms of the performance of the system at KRISS. Implementing analog control of the nanomanipulation in the SEM has improved the accuracy of CNT mounting compared to the previous digital control system. Consequently, the subsequent step of FIB alignment is no longer necessary. We have also implemented a new method of CNT cutting that uses electron beam etching instead of electrical cutting. As a result, the cutting precision has been improved by about an order of magnitude: from 300 nm down to 30 nm.