Dielectric property data measured at 100 kHz is summarized in Fig. 4. As temperature is varied, the dielectric response depends on associated changes in volume and polarizability in the dielectric41. The linear increasing trend can be attributed to the increasing polarizability of the SFO thin film with temperature, as shown in Fig. 4a and 4b. Indeed, the temperature dependence of the tunability of the SFO thin film, as shown in Fig. 4c, follows an exponential trend in the investigated temperature range. The inset of Fig. 4c shows tunability curves at selected temperatures, where the maximum tunability was calculated at 66.6 MV/m. This behavior is suggestive of the suppression of polarizability in the SFO thin film with decreasing temperature, and indicates that the temperature dependence of polarizability is a dominant effect in governing the response observed in the vacuum annealed SFO thin film42. Similar dielectric response behavior has also been seen in LaFeO3 in studies reported by Gaikwad et al.43.