Nanoscale phase distribution. a Bright-field TEM image of sample 1. b Corresponding selected area electron diffraction pattern along the  zone axis (red text labels) with additional reflections from a  oriented twin (blue text labels). The superstructure reflections of type {0,0,3/2} along the hexagonal c-axis are denoted in the line profile shown in the inset of b. c Bright-field TEM image of sample 2. d Corresponding selected area diffraction pattern along the  zone-axis. Note the difference in ordering in the line profile inset in d compared to the line profile shown in the inset in b. The scales bars in the TEM images correspond to 50 nm. The scale bars in the electron diffraction patterns correspond to 5 nm−1