In most cases, the goal of CNT tip fabrication has involved the use of straight CNTs. A cylindrical probe such as a vertical CNT can measure near-vertical sidewalls that are not re-entrant. However, for purposes of imaging vertical and re-entrant sidewalls, a tilted or bent CNT could be useful. Simply tilting a straight tip (or tilting the sample) carries a significant cost in terms of required geometrical clearance around a target feature. A vertical CNT tip with an intentional bend near the end offers the advantage of sidewall access but with much less stringent clearance requirements. Such a tip would allow access to sidewalls of one orientation. A more generally applicable solution would thus be a vertical CNT tip with lateral protrusions in both directions, thus more closely resembling the functional structure of silicon CD-AFM tips.