It has been previously discovered that a focused ion beam (FIB) can align, bend, and straighten free-standing CNTs attached at one end to a substrate.30 Subsequently, it was discovered that sufficiently thin and high aspect ratio probes can be reproducibly treated the same way regardless of material composition.31 We also found that while the aligned CNTs were being irradiated by a parallel FIB from the top, a metal ball is formed at the CNT top end through ion beam-induced deposition (IBID). Since these processes are quite simple and are already described in the references, we do not discuss them in detail in this paper.23 By modifying the FIB process for straightening CNT tips on the manipulator, we have easily fabricated a B-tip as well as J-tips for CD-AFM as shown in Fig. 2.