Such changes can have drastic effects on an electronic assembly's reliability if they are not planned for in the design process. When 3D DIC techniques are employed, out-of-plane motion can be tracked in addition to in-plane motion. Out-of-plane warpage is especially of interest at the component level of electronics packaging for solder joint reliability quantification. Excessive warpage during reflow can contribute to defective solder joints by lifting the edges of the component away from the board and creating head-in-pillow defects in ball grid arrays (BGA). Warpage can also shorten the fatigue life of adequate joints by adding tensile stresses to edge joints during thermal cycling. When a PCBA is over-constrained, thermo-mechanical stress brought about during thermal expansion can cause board strains that could negatively affect individual component and overall assembly reliability. The full-field monitoring capabilities of an image correlation technique allow for the measurement of strain magnitude and location on the surface of a specimen during a displacement-causing event, such as PCBA during a thermal profile. These "strain maps" allow for the comparison of strain levels over full areas of interest. Many traditional discrete methods, like extensometers and strain gauges, only allow for localized measurements of strain, inhibiting their ability to efficiently measure strain across larger areas of interest. DIC techniques have also been used to generate strain maps from purely mechanical events, such as drop impact tests, on electronic assemblies.