_:nf0937a06205d4e43a278736344cabe5fxb0
<http://schema.org/description>
"Standard Contact Mode AFM Probe\n\nDESCRIPTION\nTIP SPECIFICATIONS\nCANTILEVER SPECIFICATIONS \n\n\n\n\nStandard Contact Mode AFM ProbeMonolithic silicon AFM probe for contact mode and lateral force mode operation.The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.The AFM holder chip fits most commercial AFM systems as it is industry standard size.For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!\n\n\nAFM Tip\n\n\n\nSHAPE\nRotated\n\n\nTip Height\n17µmFrom 15µm To 19µm\n\n\n\n Tip Setback\n15µmFrom 10µm To 20µm\n\n\n\n Tip Radius \n&amp;lt; 10nm\n\n\n Half Cone Angle\n20°-25° along cantilever axis25°-30° from side10° at the apex\n\n\n\n\n\nAFM Cantilever\n\n\n\nShape\nBeam\n\n\nForce Constant\n0.2N/m - From 0.07N/m To 0.4N/m\n\n\n\nResonance Frequency\n13kHz - From 9kHz To 17kHz\n\n\n\n Length \n450µm - From 440µm To 460µm\n\n\n\n Width \n50µm - From 45µm To 55µm\n\n\n\n Thickness \n2µm - From 1µm To 3µm\n\n\n\n\n\n"
<https://sfr.ca/products/contal-g>