<http://schema.org/description>
"&lt;p&gt;    Available from Scienscope International, the ViewX is a high-resolution, x-ray inspection system designed for inspection of BGA, CSP, flip-chip semiconductors and multi-layer board registration. This pamphlet provides an overview of system specifications and notable features, which include real-time defect detectio&lt;/p&gt;"^^<http://www.w3.org/2001/XMLSchema#string>
<http://www.mmsonline.com/articles/x-ray-inspection-system-features-real-time-data-collection>