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Characterization of Epitaxial Semiconductor Films (Methods and Phenomena: Their Applications in Science and Technology, Vol. 2) (1976) (?)
, Band: 2, in Engels, Elsevier Science Ltd, hardeband, Gebruik
Elsevier Science Ltd , 1976. . Hardcover. Near Fine. Near Fine
Data uit 2016-11-18 04:30h
ISBN (alternatiewe skryfwyses): 0-444-41438-X, 978-0-444-41438-0
Characterization of Epitaxial Semiconductor Films, Volume 2: Methods and Phenomena: Their Applications in Science and Technology (1976) (?)
9780444414380 (?) of 044441438X
, Band: 2, in Engels, Elsevier, hardeband
Gestuur koste aan: USA
Elsevier, 1976. 216 pp., hardcover, previous owner's signature to front free endpaper, else very good
Data uit 2016-11-18 04:30h
ISBN (alternatiewe skryfwyses): 0-444-41438-X, 978-0-444-41438-0
Characterization of Epitaxial Semiconductor Films (Methods and Phenomena: Their Applications in Science and Technology, Vol. 2) (?)
9780444414380 (?) of 044441438X
, Band: 2, in Engels, Elsevier Science Ltd, Gebruik
Gratis gestuur nach: USA
Elsevier Science Ltd. Used - Good. Former Library book. Shows some signs of wear, and may have some markings on the inside. 100% Money Back Guarantee. Shipped to over one million happy customers. Your purchase benefits world literacy!
Data uit 2016-11-18 04:30h
ISBN (alternatiewe skryfwyses): 0-444-41438-X, 978-0-444-41438-0
Characterization of Epitaxial Semiconductor Films (Methods and Phenomena: Their Applications in Science and Technology, Vol. 2) (1976) (?)
9780444414380 (?) of 044441438X
, Band: 2, in Engels, Elsevier Science Ltd, hardeband, Gebruik
plus gestuur, Verandgebiet: EUR
Very Good. Refurbished. Hardcover
Data uit 2016-11-18 04:30h
ISBN (alternatiewe skryfwyses): 0-444-41438-X, 978-0-444-41438-0
Characterization of Epitaxial Semiconductor Films (1976) (?)
9780444414380 (?) of 044441438X
, in Engels, Elsevier Science Ltd, Gebruik
228 Seiten ex Library Book / aus einer wissenschafltichen Bibliothek / Sprache: Deutsch Gewicht in Gramm: 550
Kategorie: Technology|Electronics|Semiconductors, Technology|Material Science
Sleutelwoorde: CONDENSED MATTER PHYSICS (LIQUID STATE & SOLID PHYSICS), SEMICONDUCTORS, SCIENCE /
Data uit 2017-03-21 20:02h
ISBN (alternatiewe skryfwyses): 0-444-41438-X, 978-0-444-41438-0
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Beskikbaar skaars boeke, gebruikte boeke en tweede hand boeke van die titel "Characterization of Epitaxial Semiconductor Films, Volume 2: Methods and Phenomena: Their Applications in Science and Technology" uit Editor: Henry Kressel word gelys heeltemal.
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