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The Si-Sio2 System (Materials Science Monographs) (1988) (?)
, in Engels, Elsevier Science Ltd, Gebruik
Former Library book. Shows definite wear, and perhaps considerable marking on inside.
ISBN (alternatiewe skryfwyses): 0-444-42603-5, 978-0-444-42603-1
The Si-Sio2 System (Materials Science Monographs) (?)
9780444426031 (?) of 0444426035
, in Engels, Elsevier Science Ltd, Gebruik
Gratis gestuur nach: USA
Elsevier Science Ltd. Used - Acceptable. Former Library book. Shows definite wear, and perhaps considerable marking on inside. 100% Money Back Guarantee. Shipped to over one million happy customers. Your purchase benefits world literacy!
Data uit 2016-11-18 04:58h
ISBN (alternatiewe skryfwyses): 0-444-42603-5, 978-0-444-42603-1
The Si-Sio2 System (Materials Science Monographs) (1988) (?)
9780444426031 (?) of 0444426035
, in Engels, Elsevier Publishing Company, hardeband, Gebruik
plus gestuur, Verandgebiet: DOM
Data uit 2016-11-18 04:58h
ISBN (alternatiewe skryfwyses): 0-444-42603-5, 978-0-444-42603-1
Editor: Pieter Balk (?):
The Si-Sio2 System (Materials Science Monographs) (1988) (?)
9780444426031 (?) of 0444426035
, in Engels, 366 bladsye, Elsevier Science Ltd, hardeband, Gebruik
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The Si-SiO 2 system has been the subject of concentrated research for over 25 years, particularly because of its key role in silicon integrated circuits. However, only a few comprehensive treatises on this field have been published in recent years. This book focuses on the materials science and technology aspects of the system. Its aim is to give a comprehensive overview of the topic, including an extensive list of references giving easy access to the literature. After an introductory chapter which reviews the Si-SiO 2 system from the perspective of other semiconductor-insulator combinations of technical interest, the technology of oxide preparation is discussed. Fundamental questions regarding the structure and chemistry of the interfacial region are then addressed. Two chapters are concerned with system properties: one deals with the physico-chemical, electrical and device-related characteristics and the way these are affected by the technology of oxide preparation; a second chapter focuses on point defects and charge trapping. The book concludes with a broad review of the techniques available for electrical characterization of the system, including the physical background. Hardcover, Label: Elsevier Science Ltd, Elsevier Science Ltd, Produktgruppe: Book, Publiziert: 1988-08, Studio: Elsevier Science Ltd, Verkaufsrang: 15624069
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Data uit 2016-11-18 04:58h
ISBN (alternatiewe skryfwyses): 0-444-42603-5, 978-0-444-42603-1
9780444426031 (?) of 0444426035
, in Engels, Elsevier Science, hardeband, Nuwe
SI-SiO2-System~~P-Balk, SI-SiO2 System, Hardcover
Data uit 2016-11-18 04:58h
ISBN (alternatiewe skryfwyses): 0-444-42603-5, 978-0-444-42603-1
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