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Ari Virtanen - Tutkimusportaali - Converis - Jyväskylän yliopisto
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Testaamme kiihdytinlaboratorion hiukkaskiihdyttimellä säteilyn aiheuttamia virheitä elektroniikan komponenteissa. Näin autamme mm. satelliittiteollisuutta kehittämään avaruuden säteilyolosuhteissa kauemmin kestäviä elektronisia laitteita. Säteilyvaikutusten tutkimus on laajenemassa myös maanpäällisiin sovelluksiin.
Radiation and Reliability Challenges for Electronics Used in Space, Aviation, Ground and Accelerators
Utillisation of the High Energy Heavy Io
Single Event Radiation Effects in Harden
R2RAM Radiation Hard Resistive Random-Ac
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Radiation Characterisation of EEE components for ESA space applications
Aalto-1, multi-payload CubeSat : Design, integration and launch (2021) Praks,J.; et al.; A1; OA
Irradiation of the head reduces adult hippocampal neurogenesis and impairs spatial memory, but leaves overall health intact in rats (2021) Lensu, Sanna; et al.; A1; OA
Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with Y-rays, X-rays, Protons and Heavy Ions (2019) Andreou, Charalambos M.; et al.; A1; OA
Mechanisms of Electron-Induced Single Event Latchup (2019) Tali, Maris; et al.; A1; OA
Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs (2018) Tali, Maris; et al.; A1; OA
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory (2018) Bosser, Alexandre; et al.; A1; OA
Space Radiation Effects in Electronics (2018) Dilillo, Luigi; et al.; A3
Application and development of ion-source technology for radiation-effects testing of electronics (2017) Kalvas, Taneli; et al.; A1
Determination of electronic stopping powers of 0.05–1 MeV/u 131Xe ions in C-, Ni- and Au-absorbers with calorimetric low temperature detectors (2017) Echler, A.; et al.; A1
Heavy Ion Induced Degradation in SiC Schottky Diodes : Bias and Energy Deposition Dependence (2017) Javanainen, Arto; et al.; A1; OA
Heavy-Ion-Induced Degradation in SiC Schottky Diodes : Incident Angle and Energy Deposition Dependence (2017) Javanainen, Arto; et al.; A1; OA
High-Energy Electron-Induced SEUs and Jovian Environment Impact (2017) Tali, Maris; et al.; A1
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells (2017) Bagatin, Marta; et al.; A1; OA
Charge Transport Mechanisms in Heavy-Ion Driven Leakage Current in Silicon Carbide Schottky Power Diodes (2016) Javanainen, Arto; et al.; A1; OA
Effects of high-energy electrons in advanced NAND flash memories (2016) Bagatin, Marta; et al.; A4
Viimeisin päivitys 2020-01-01 klo 05:39
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