text: Despite early successes such as the determination of the positions of hydrogen atoms in NHCl crystals by W. E. Laschkarew and I. D. Usykin in 1933, boric acid by John M. Cowley in 1953 and orthoboric acid by William Houlder Zachariasen in 1954, electron diffraction for many years was a qualitative technique used to check samples within electron microscopes. John M Cowley explains in a 1968 paper: This has changed, in transmission, reflection and for low energies. Some of the key developments (some of which are also described later) from the early days to 2023 have been:
  *Fast numerical methods based upon the Cowley-Moodie multislice algorithm, which only became possible once the fast Fourier transform (FFT) method was developed. With these and other numerical methods Fourier transforms are fast, and it became possible to calculate accurate, dynamical diffraction in seconds to minutes with laptops using widely available multislice programs.
  *Developments in the convergent-beam electron diffraction approach.  Building on the original work of Walther Kossel and Gottfried Möllenstedt in 1939, it was extended by Peter Goodman and Gunter Lehmpfuhl, then mainly by the groups of John Steeds and Michiyoshi Tanaka who showed how to determine point groups and space groups. It can also be used for higher-level refinements of the electron density; for a brief history see CBED history. In many cases this is the best method to determine symmetry.
  *The development of new approaches to reduce dynamical effects such as precession electron diffraction and three-dimensional diffraction methods. Averaging over different directions has, empirically, been found to significantly reduce dynamical diffraction effects, e.g., see PED history for further details. Not only is it easier to identify known structures with this approach, it can also be used to solve unknown structures in some cases – see precession electron diffraction for further information.
  *The development of experimental methods exploiting ultra-high vacuum technologies (e.g. the approach described by  in 1953) to better control surfaces, making LEED and RHEED more reliable and reproducible techniques. In the early days the surfaces were not well controlled; with these technologies they can both be cleaned and remain clean for hours to days, a key component of surface science. 
  *Fast and accurate methods to calculate intensities for LEED so it could be used to determine atomic positions, for instance references. These have been extensively exploited to determine the structure of many surfaces, and the arrangement of foreign atoms on surfaces.
  *Methods to simulate the intensities in RHEED, so it can be used semi-quantitatively to understand surfaces during growth and thereby to control the resulting materials. 
  *The development of advanced detectors for transmission electron microscopy such as charge-coupled device and direct electron detectors, which improve the accuracy and reliability of intensity measurements. These have efficiencies and accuracies that can be a thousand or more times that of the photographic film used in the earliest experiments, with the information available in real time rather than requiring photographic processing after the experiment.