text: Texture can be determined by various methods. Some methods allow a quantitative analysis of the texture, while others are only qualitative. Among the quantitative techniques, the most widely used is X-ray diffraction using texture goniometers, followed by the electron backscatter diffraction (EBSD) method in scanning electron microscopes. Qualitative analysis can be done by Laue photography, simple X-ray diffraction or with a polarized microscope. Neutron and synchrotron high-energy X-ray diffraction are suitable for determining textures of bulk materials and in situ analysis, whereas laboratory x-ray diffraction instruments are more appropriate for analyzing textures of thin films.
  Texture is often represented using a pole figure, in which a specified crystallographic axis (or pole) from each of a representative number of crystallites is plotted in a stereographic projection, along with directions relevant to the materials processing history. These directions define the so-called sample reference frame and are, because the investigation of textures started from the cold working of metals, usually referred to as the rolling direction RD, the transverse direction TD and the normal direction ND'. For drawn metal wires the cylindrical fiber axis turned out as the sample direction around which preferred orientation is typically observed (see below).