text: An ATM designed with a rotated sample is typically a far-field measurement configuration using a time-domain spectroscopy strategy.
  A high power infrared laser is typically used. Its beam is split by a beamsplitter into two optical paths: a probe beam and a THz generation beam.
  The THz generation beam typically receives the greater fraction of NIR power in order to maximize the power of the THz light commonly generated by a voltage-pulsed photoconductive antenna. The generated THz light is collected through a hyper-hemispherical silicon lens and passed to an off-axis parabolic mirror that collimates the THz beam for polarization by a THz polarizer that is often made of a simple wire-grid. The linearly polarized THz beam is then focused by a second off-axis parabolic mirror onto the sample. The THz beam transmitted through the sample is again collected by a third off-axis parabolic mirror, collimated onto a fourth parabolic mirror that then focuses the beam onto an electro-optic (EO) crystal whose birefringence is perturbed by the strength of the THz beam.
  The NIR probe beam is passed through the EO crystal to probe the induced degree of birefringence caused by the THz beam and passed to a detection module that often consists of an NIR quarter wave plate, a Wollaston prism that spatially separates orthogonal polarization states of the probe beam into two optical paths that are individually detected at a balanced detector. The resulting signal reported by the balanced detector is a measure of the difference in magnitude of these two orthogonal components of the NIR probe beam and therefore a direct correlation of the degree of birefringence induced in the EO crystal by the THz beam passed through the sample.