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  Low-energy electron diffraction (LEED) is a technique for the determination of the surface structure of single-crystalline materials by bombardment with a collimated beam of low-energy electrons (30–200 eV). In this case the Ewald sphere leads to approximately back-reflection, as illustrated in Figure 20, and diffracted electrons as spots on a fluorescent screen as shown in Figure 21; see the main page for more information and references. It has been used to solve a very large number of relatively simple surface structures of metals and semiconductors, plus cases with simple chemisorbants. For more complex cases transmission electron diffraction or surface x-ray diffraction have been used, often combined with scanning tunneling microscopy and density functional theory calculations.
  LEED may be used in one of two ways:
  # Qualitatively, where the diffraction pattern is recorded and analysis of the spot positions gives information on the symmetry of the surface structure. In the presence of an adsorbate the qualitative analysis may reveal information about the size and rotational alignment of the adsorbate unit cell with respect to the substrate unit cell.
  # Quantitatively, where the intensities of diffracted beams are recorded as a function of incident electron beam energy to generate the so-called I–V curves. By comparison with theoretical curves, these may provide accurate information on atomic positions on the surface.