text: # J.P. Thomas, A. Oladipo and M. Fallavier; 1988;B32: 354–359.
  #  J.P. Thomas, A. Oladipo and M. Fallavier; 1988; "Secondary Ion Emission Induced in Insulators: Analytical Applications"605-611.
  #  J.P. Thomas, A. Oladipo and M. Fallavier; 1989; "Collective Effects in the Desorption Process Induced by Hn+ Clusters near the Bohr's Velocity";
  #   J.P. Thomas, A. Oladipo and M. Fallavier; 1989; "Surface Profiling of Insulating  Layers using Desorption Induced by Monatomic or Cluster Ions of Beam Diameter in the 5–10µm Range";
  #    A. Oladipo, M. Fallavier and J.P. Thomas; 1991; "Secondary Ion Emission from Cesium Salts under Megaelectronvolt Ion Bombardment: Comparative Study and Beam Secondary Effects";.
  #  B. Nsouli, P. Rumeau, H. Allali, B. Chabert, O. Debre, A. A. Oladipo, J. P. Soulier and J. P. Thomas;  1995; "Plasma Desorption Time-of-flight Mass Spectrometric Elucidation of the Mechanisms of Adhesion Enhancement between Plasma-treated PEEK-Carbon Composite and an Epoxyamine Adhesive";
  # H. Allali, O. Debre, B. Lagrange, B. Nsouli, A. A. Oladipo and J. P. Thomas; 1995; "Spontaneous Desorption : A Controlled Phenomenon for Surface Analysis Application? Part I : New evidence for a sputtering process induced by a well localized field enhanced desorption";
  #    C. A Adesanmi, I. A. Tubosun, F. A. Balogun, and A. A. Oladipo; 1997; "Advantages of Combined IENAA and Ko-factor Technique in the Determination of U and Th Concentrations in Exploration Rock Samples";
  #   H. Allali, M. Ben Embarek, O. Debre, B. Nsouli, A. Oladipo, A. Roche and J. P. Thomas: 1997; "An HSF-SIMS Investigation of the Prephosphatation Contribution to the Phosphatation Process of Silicon Steel Surface"; Rapid Comm. Mass Spectr. 11 1377–1382.
  # C. A. Adesanmi, F. A. Balogun, M. K. Fasasi, I. A. Tubosun, A. A. Oladipo; 2001; A semi- empirical formula for HPGe detector efficiency calibration;