text: Charge referencing is needed when a sample suffers a charge induced shift of experimental binding energies to obtain meaningful binding energies from both wide-scan, high sensitivity (low energy resolution) survey spectra (0-1100 eV), and also narrow-scan, chemical state (high energy resolution) spectra. Charge induced shifting is normally due to a modest excess of low voltage (-1 to -20 eV) electrons attached to the surface, or a modest shortage of electrons (+1 to +15 eV) within the top 1-12 nm of the sample caused by the loss of photo-emitted electrons. If, by chance, the charging of the surface is excessively positive, then the spectrum might appear as a series of rolling hills, not sharp peaks as shown in the example spectrum.
  Charge referencing is performed by adding a Charge Correction Factor to each of the experimentally measured peaks. Since various hydrocarbon species appear on all air-exposed surfaces, the binding energy of the hydrocarbon C (1s) XPS peak is used to charge correct all energies obtained from non-conductive samples or conductors that have been deliberately insulated from the sample mount. The peak is normally found between 284.5 eV and 285.5 eV. The 284.8 eV binding energy is routinely used as the reference binding energy for charge referencing insulators, so that the charge correction factor is the difference between 284.8 eV and the experimentally measured C (1s) peak position.
  Conductive materials and most native oxides of conductors should never need charge referencing. Conductive materials should never be charge referenced unless the topmost layer of the sample has a thick non-conductive film. The charging effect, if needed, can also be compensated by providing suitable low energy charges to the surface by the use of low-voltage (1-20 eV) electron beam from an electron flood gun, UV lights, low-voltage argon ion beam with low-voltage electron beam (1-10 eV), aperture masks, mesh screen with low-voltage electron beams, etc.