text: By using CBED, the following information can be obtained: 
  *parameters of the crystal lattice, sample thickness
  *strain distribution
  *defects such as stacking faults, dislocations, grain boundaries, three-dimensional deformations, lattice displacements
  *crystal symmetry information - by looking at the symmetries that appear in the CBED disks, point group and space group determination are performed.
  *Diagnosis of aberrations in the electron probe that limit resolution, through analysis of CBED patterns (i.e. Ronchigrams) acquired on amorphous specimens.