text: Numerous destructive and non-destructive evaluation (NDE) methods exist for characterizing coatings. The most common destructive method is microscopy of a mounted cross-section of the coating and its substrate. The most common non-destructive techniques include ultrasonic thickness measurement, X-ray fluorescence (XRF), X-Ray diffraction (XRD) and micro hardness indentation. X-ray photoelectron spectroscopy (XPS) is also a classical characterization method to investigate the chemical composition of the nanometer thick surface layer of a material. Scanning electron microscopy coupled with energy dispersive X-ray spectrometry (SEM-EDX, or SEM-EDS) allows to visualize the surface texture and to probe its elementary chemical composition. Other characterization methods include transmission electron microscopy (TEM), atomic force microscopy (AFM), scanning tunneling microscope (STM), and Rutherford backscattering spectrometry (RBS). Various methods of Chromatography are also used, as well as thermogravimetric analysis.