text: referring now to the drawings , fig1 illustrates a sensor to be used in the system 12 of the present invention . the sensor 10 has an optical fiber 14 containing a first optical fiber bragg grating laser 16 and a second optical fiber bragg grating laser 18 . the bragg gratings of each of the lasers 16 and 18 reflects at a different wavelength so that the lasers 16 and 18 emit at different wavelengths . the sensor 10 is designed so that the measurand has a different effect on the two lasers 16 and 18 . in one embodiment of the sensor 10 , one of the lasers 16 and 18 may be sensitive to the measurand while the other of the lasers is insensitive . in a second embodiment of the sensor 10 , each of the lasers 16 and 18 may be sensitive to the measurand but in the opposite direction . the sensor 10 may be used to measure any measurand provided that the sensor structure can be designed which strains the fiber lasers 16 and 18 in the manner just described . as the measurand shifts , the difference in wavelength between the two lasers 16 and 18 changes and the difference can be calibrated to the value of the measurand to provide an absolute measurement . referring now to fig2 a multiplexed fiber laser sensor system 12 is illustrated . in this system , a single optical fiber 20 contains numerous fiber lasers 22 , two of which form each sensor 24 . each laser 22 is located spectrally at a different wavelength . the system includes a pump laser 26 which provides pump light at the distinct pump wavelength through a wavelength demultiplexer 28 . the pump light travels down the optical fiber 20 and is absorbed within each fiber laser cavity , causing each laser 22 to lase at its distinct wavelength in a continuous manner . the light from each laser 22 returns down the optical fiber 20 , through the wavelength demultiplexer 28 , through an optional fiber amplifier 30 , to a filter 32 . the filter 32 passes a narrow wavelength band and is tunable to change the band selected . the band is wide enough to pass the laser signals from both lasers 22 comprising a single one of the sensors 24 . all other lasers 22 are blocked or severely attenuated . the signals then pass to a junction 34 where the light is split to two scanning fabry - perot spectrum analyzers 36 and 38 . one such device which may be used for each of the analyzers 36 and 38 is the supercavity device from newport corporation of irvine , calif . such devices provide high finesse , thus giving a high ratio of dynamic range to accuracy . a scanning fabry - perot spectrum analyzer is characterized by a free spectral range which is the spectral dynamic range over which spectral features can be unambiguously identified . two laser sensors must emit at wavelengths within one free spectral range of each other if the scanning fabry - perot spectrum analyzer is to read the spectral difference accurately . in a typical sensor system , the laser sensors should be separated by a particular spectral distance . this would normally set the requirement for a scanning fabry - perot spectrum analyzer with a greater free spectral range . since the resolution is directly related to the free spectral range , this yields a limitation on the resolution that may be achieved . the present invention however includes a means to measure spectral features which are separated by more than one free spectral range without ambiguity . this effectively extends the dynamic range of the device without sacrificing its resolution . this in turn allows greater resolution in the readout of the sensor . the two scanning fabry - perot spectrum analyzers 36 and 38 differ in construction by the gap of the etalon and hence the free spectral range . the first analyzer 36 has a small gap , l 1 , on the order of about 20 microns . such a device with a finesse of 5000 will have a free spectral range of 60 nanometers . the free spectral range is the spectral range between orders of the interferometer . when two lasers at different wavelengths are injected into the analyzer 36 , an output trace such as that shown in fig3 is provided . one laser 22 in the sensor 24 produces several narrow peaks 40 separated by the free spectral range of the fabry - perot for that wavelength . the second laser 22 in the sensor 24 produces another set of peaks 42 with a slightly different spacing . the order number for each peak is given by the equation : where n is the order number , l 1 is the gap of the first analyzer 36 , and λ is the emission wavelength of the laser whose peak is being considered . the free spectral range ( fsr ) is much greater than the difference in emission wavelength of the two fiber lasers in the sensor 24 . as a result , their peaks appear close together and the peaks share the same order . to perform a measurement , the trace generated by the scanning fabry - perot spectrum analyzer 36 is transmitted to a computer 37 where it is digitized and where a computer program analyzes the trace of fig3 . the computer 37 may comprise any suitable computer known in the art . the computer program may be any suitable program for identifying the two peaks 40 and 42 and for determining the spectral spacing of the peaks , δλ 1 . the computer program can be in any conventional computer language known in the art . another portion of the light enters the second analyzer 38 . this device has a smaller gap , l 2 , on the order of about 25 mm . as a result , the analyzer 38 has very high resolution but a small free spectral range . the difference in laser emission wavelength of the two lasers 22 in the sensor 24 is so large in contrast to the free spectral range of the analyzer 38 , that adjacent peaks of the two lasers do not have the same order number . the order number of a laser line in this analyzer is given by the equation : where n is the order number , l 2 is the gap of the analyzer 38 , and λ is the emission wavelength of the laser whose peak is being considered . to obtain the spectral difference between the two lasers 22 in a sensor 24 with the resolution of the analyzer 38 , it is necessary to measure the difference between the peaks of the same order . in a typical scanning fabry - perot spectrum analyzer , this is not possible because the scan range may not be sufficient that the same order is even displayed for each laser . furthermore , it is not possible to tell the order number of each line . this invention uses the δλ 1 information from the analyzer 36 to calculate the order number difference between two selected peaks on the second analyzer 38 . the measured spectral difference between these two peaks can then be corrected for the order number difference to give the true spectral difference between the outputs of the lasers 22 in the sensor 24 . the trace from the analyzer 38 is also transmitted to computer 37 where it is digitized and the aforementioned computer program is used to analyze the trace . the computer program in the computer 37 identifies two adjacent peaks , one corresponding to each of the lasers 22 . the scanning fabry - perot spectrum analyzer scan distance corresponding to the first laser is d 1 , while the distance corresponding to the second laser is d 2 . the computer program also identifies the peaks corresponding to the same laser by looking for uniform spectral differences . the scan difference between two adjacent peaks of the same laser is calculated and gives the laser wavelength . this gives the emission wavelength of the first laser λ 1 , and that of the second laser , λ 2 . the emission wavelength of the second laser 22 may also be computed as : it should be noted that λ ′ rather than λ 2 has been used in this calculation . the accuracy of δn depends on the accuracy of the difference between the two wavelengths and using λ 2 ′ is more accurate . the scan distance difference between the two adjacent peaks of the two different lasers is : this is now corrected by the order number difference so that the scan distance of two same order peaks are compared : the sensor measurand is proportional to this corrected scan distance difference . calibration of the sensor will yield the calibration factor . it is noted that the use of the order number correction has allowed the system to compare features in the second analyzer 38 that do not have the same order number . it has thus greatly expanded the dynamic range of the analyzer 38 and allowed it to be configured for finer resolution . an option is to do the entire order number correction using a single scanning fabry - perot spectrum analyzer . in the above illustration , λ 2 could have been used instead of λ 2 ′ in the equation for δn . since it is available directly from the trace of the second analyzer 38 , the first analyzer 36 is not required . however , to ensure that the order number difference δn is calculated without error , the scanning fabry - perot spectrum analyzer &# 39 ; s cavity must be shortened , limiting its resolution . this option is useful when less resolution is required by the application . it reduces the system components and the cost . an alternative configuration for the system 12 is shown in fig4 . in this system 12 , the returning light is split by an optical coupler 50 into two paths . a tunable narrowband filter 52 is placed in either path . one filter 52 selects the wavelengths of the first laser sensor 22 of the sensor 24 to be selected . the other filter 52 selects the wavelength of the second laser sensor 22 of the sensor 24 to be selected . these are then combined by another coupler 54 and then split to the two analyzers 36 and 38 . this alternative configuration allows a narrower filter because each filter 52 passes one instead of two lasers . this in turn allows the lasers 22 to be placed closer in wavelength and more lasers to be placed on each optical fiber 20 . as can be seen from the foregoing discussion , the system of the present invention achieves very fine strain sensitivity , yet does so with absolute measurements . this level of absolute strain sensitivity exceeds that achieved by other techniques . many sensors are multiplexed on a single fiber . by achieving high sensitivity , large dynamic range is achieved without requiring the laser sensors to vary too far in wavelength . this allows more sensors to be placed per fiber . the measurement provided by the system of the present invention is fast as compared to alternative absolute measurement techniques . this results because the requirement to scan an optical component by several centimeters is eliminated . the rapid , short distance scanning of the piezo transducers in the scanning fabry - perot spectrum analyzer is sufficient . the measurement technique employed herein provides high dynamic range . it should also be noted that common mode effects affecting both lasers of a sensor are eliminated . as an example , temperature may cause a fiber laser sensor to shift . this shift can cause a signal erroneously interpreted as a shift in the measurand . because both lasers are co - located , they both shift in the same manner with temperature and their difference is approximately temperature insensitive . if desired , the two lasers 22 comprising one of the sensors 24 may also be located on separate optical fibers . when such a configuration is used , after their filters , they would be combined by a single coupler . it should be noted that any sensor configuration which results in the measurand producing a different effect on the two lasers may be used in the system of the present invention . it is apparent that there has been provided in accordance with the present invention a multiplexed fiber laser sensor system which fully satisfies the objects , means , and advantages set forth hereinbefore . while the invention has been described in the context of specific embodiments thereof , other alternatives , modifications , and variations will become apparent to those skilled in the art having read the foregoing description . therefore , it is intended to embrace those alternatives , modifications , and variations which fall within the broad scope of the appended claims .