## Study of the effect of external noise pickups on the performance of a cryogenic bolometer

A. Garai, 1,2 A. Reza, 3,a) A. Mazumdar, 1,2  H. Krishnamoorthy, 1,2  G. Gupta, 3 M.S. Pose, 3  S. Mallikarjunachary, 3  V. Nanal, 3  R. G. Pillay, 3,b) and S. Ramakrishnan 4

- 1 India-based Neutrino Observatory, Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai 400005, India 2 Homi Bhabha National Institute, V.N. Purav Marg, Anushaktinagar, Mumbai 400094, India
- 3 Department of Nuclear and Atomic Physics, Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai 400005, India
- 4 Deptment of Condensed Matter Physics &amp; Materials Science, Tata Institute of Fundamental Research, Homi Bhabha Road,Mumbai 400005, India

a) Electronic mail

: ashifreza86@gmail.com b) Present address : Department of Physics, Indian Institute of Technology Ropar, Rupnagar - 140001, India

This paper reports the detailed noise characterization, investigation of various noise sources and its mitigation to improve the performance of a cryogenic bolometer detector. The noise spectrum has been measured for a sapphire bolometer test setup with indigenously developed NTD Ge sensor in the CFDR system at Mumbai. The effect of external noise, arising either from ground loops in the system or from the diagnostic and control electronics of the cryostat, on the performance of a cryogenic bolometer is assessed. A systematic comparison of the influence of different noise pickups on the bolometer resolution is also presented. The best-achieved resolution (  E) at 15mK is ~15 keV for heater pulses and appears to be mainly limited by the noise due to the pulse tube cryocooler.

Over the last few decades, there is a strong interest in application  of  cryogenic  bolometers  in  rare  decay  studies due  to  their  excellent  energy  resolution,  high  sensitivity and  a  possibility  to  upscale  the  size 1-2 .      Generally,  the performance of cryogenic bolometers is not limited by the intrinsic resolution, but by the external noise sources in the system 3 .  To  achieve  operating  temperatures  of  5-10mK, the pulsed tube based cryogenic systems, are attractive for long term operations in underground laboratories.  In these systems, noise induced due to the mechanical vibrations is a  major  concern  and  attempts  to  reduce  the  same  have been reported 4-5 . Other significant contributions arise from the mK  thermometry  (sensor+readout  electronics)  and system specific components  like vacuum  pumps  and control units.  In addition, minimization of ground loops is essential. With this motivation, we have studied the noise spectra  of  a  test  bolometer  in  the  cryogen  free  dilution refrigerator.

The CFDR-1200 (Leiden Cryogenics) has been set up 6 at  Tata  Institute  of  Fundamental  Research,  Mumbai,  for the  prototype  development  of  a  Sn  cryogenic  bolometer ( TIN.TIN -The  INdia  based  TIN  detector) .  To  minimize 7 the  pulse  tube  vibration,  a  linear  drive  unit  is  used  to smoothen the movement of motorized rotary valve control unit. The mixing chamber temperature ( T MC) is monitored by  a  Carbon  Speer  sensor,  calibrated  against  a  Cerium Magnesium Nitrate (CMN) thermometer. The CFDR setup is  enclosed  within a Faraday Cage to reduce the effect of EMI. The valve control unit of the pulse tube cooler is kept detached from the cryostat body to minimize the  induced vibration.  Presently,  a  test  bolometer  setup  is  developed comprising a sapphire absorber (20mm  20mm  0.4mm), indigenously    fabricated  NTD  Ge  sensor 8-9 and  a  heater element, which are strongly coupled to the absorber using a low-temperature Araldite. The absorber is weakly connected to the Cu block using 0.1mm thick Araldite dots (dia~1mm).  The  heater  is  developed  by  evaporating  a 0.2µm  thick  Au  meander  on  a  Si  substrate.  The  heater resistance, measured using an AC resistance bridge AVS47B (PICOWATT), is ~ 0.6kΩ at 1K and remains constant down to 10mK. The NTD Ge sensors (6mm  3mm  1mm) are developed in-house. Measurements of the resistance of NTD Ge sensor ( R S) are done with AVS-47B for R S&lt;2MΩ. At lower temperatures, (i.e. R S&gt;2MΩ), R S  is measured  by  applying  a  pseudoconstant  current,  generated  by  the  voltage V B  through  a high  resistor  ( R B1=20GΩ),  connected  in  series  with  the sensor (Fig. 1).

The  resistance  ( R S)  for  the  NTD  Ge  Sensor  (DB27) has  been  measured  in  the  range  of  10-400mK.  It  was observed that the measured resistance showed a deviation from the Mott behaviour 10  below 50mK and saturated at ~ 250MΩ, even though T MC cools down to 10mK. Therefore, noise spectra have been recorded to understand the effect of various external noise sources.

One  of  the major  factors limiting the bolometer performance can be inefficient grounding leading to several ground loops. To overcome this, ground

FIG. 1. Schematic circuit for the sapphire bolometer readout.

![image](https://ac.marcodsn.me/arxiv-markdown-images/1908.00002v1-figure-323b4d51-54eb-4d00-9551-b40b0d3da829.jpg)

Faraday Cage

FIG. 2. A schematic layout of optimized ground configuration.

![image](https://ac.marcodsn.me/arxiv-markdown-images/1908.00002v1-figure-b4f65da4-49fe-43eb-a2fc-9276dc3a7911.jpg)

connections to various units are fanned out from a specially designated clean earth pit. The chassis acts as a master  ground  for  the  DAQ  box,  the  amplifier,  the  AVS preamplifier  as  well  as  the  cryostat  (see  Figure  2).  The CFDR cryostat, the differential amplifier and DAQ signal box,  AVS  preamplifiers  for  diagnostic  thermometry  and the  sensor  readout are  enclosed  within  the  Faraday  Cage. The CFDR controls for  3 He- 4 He gas handling system and accessories are routed through an optically isolated USBRS232  interface.  The  NI-PXI  chassis,  AVS  bridges  and PCs  are  fitted  in  an  anodized  metallic  rack.  The  PXI  is connected to the PC with an optical link to reduce the EMI pickups.

As  an  example  of  a  ground  loop  in  the  sub-optimal grounding,  the  master  ground  is  assigned  to  the  cryostat, which  results  in  multiple  ground  connections  for  DAQthrough the cryostat and through the power connection. In this  configuration,  50Hz  and  its  harmonics  are  clearly visible in the noise spectra (Fig. 3a). As a result, the T MC could not be stabilized below 15mK.

Further  noise  measurements  have  been  carried  out with optimal grounding at T MC=10mK for four configurations: Case-I :  pulse  tube  in  normal  drive,  motor head mounted on the cryostat; Case-II : pulse tube in linear drive,  motor  head  detached  from  the  cryostat; Case-III : Case-II configuration with gauge  electronics of Inner Vacuum Chamber disconnected; Case-IV : Case-II configuration with electronics of all vacuum gauges

FIG. 3. FFT spectra of DB27 output showing (a) Effect of ground loops on 50Hz noise at T MC = 15 mK (b) Effect of pulse tube induced noise.

![image](https://ac.marcodsn.me/arxiv-markdown-images/1908.00002v1-figure-e409f7c3-e953-4a7a-b37b-273d5e2f6d38.jpg)

![image](https://ac.marcodsn.me/arxiv-markdown-images/1908.00002v1-figure-065ac193-9b27-408c-847d-1f8c11af707e.jpg)

disconnected. In all four cases, noise spectra are measured over a frequency range of 0-25kHz with a voltage gain of 80dB. Noise peaks at 9.75Hz, 11.25Hz and 140Hz seen in Fig. 3b for Case-I are mainly contributed by the harmonics of pulse tube induced noise of 1.4Hz, which disappears for linear  drive  mode  in  Case-II.  This  helps  in  cooling  the sensor,  which is also reflected in the  measured resistance of 370MΩ as compared to 250MΩ for Case-I.  However, no appreciable difference in the FFT spectra above 500Hz is  observed  between  Case-I  and  Case-II.  Vacuum  pumps and  gauges  are  found  to  contribute  to  high  frequency pickups  at  827Hz,  985.5Hz  and  16kHz.  Details  of  the various noise pickups are summarized in Table I. In CaseIV, the measured resistance is 594MΩ.

Figure 4(a) shows  that the sensor resistance has increased  substantially  in  Case-IV  as  compared  to  Case-I and  the  sensor  follows  Mott  behavior  down  to  40mK indicating a net improvement in reducing the heat leak to the sensor. The effect of ground loops was also reflected in the  minimum T MC  and  in  the  measured  resolution.  For Case-IV, T MC  ~  5mK  could  be  achieved  as  compared  to 6.7mK in the sub-optimal case.

TABLE. 1. Output voltage in dB (text in italics) for different frequencies as measured from the noise spectra. (BBN: Below Baseline Noise)

|                 | Frequency (Hz)   |   Frequency (Hz) |   Frequency (Hz) |   Frequency (Hz) | Frequency (Hz)   |
|-----------------|------------------|------------------|------------------|------------------|------------------|
| Different Cases | 9.75/11.25/140   |            543.5 |            827.5 |            985.5 | 15.73k/ 16.27k   |
| Case-I          | -64/-62/-70      |            -63   |            -64   |            -62   | -55              |
| Case-II         | BBN              |            -62.5 |            -65.7 |            -58.3 | -59              |
| Case-III        | BBN              |            -62   |            -70.4 |            -60.4 | BBN              |
| Case-IV         | BBN              |            -63   |            -71.6 |            -60.2 | BBN              |

FIG. 4. (a)  Measured  resistance  of  DB27  for  T=10  -  400  mK  together with standard Mott curve fit ( R 0 = 10.2 (0.5) Ω and T 0 = 12.2 (0.2) K) (b) Measured bolometer resolution with the phonon signal.

![image](https://ac.marcodsn.me/arxiv-markdown-images/1908.00002v1-figure-532da0ce-caa8-4e51-b570-383cf64d86bb.jpg)

To  measure  the  bolometer  resolution,  an  external phonon signal is generated, by connecting a 2MΩ resistor ( R B2)  in  series  with  the  heater  (Fig.  1).  The  pulses  of varying  amplitude,  200µs  wide  with  a  repetition  rate  of 2Hz, are supplied to the heater to simulate phonon signal. The voltage signal  from the  sensor  is  analyzed  off-line 11 . Figure  4(b)  shows  that  the  measured  resolution  at  15mK for  Case-IV,  which  worsens by ~80% in case of the suboptimal grounding. The resolution is found to improve by ~30% when the pulse tube is switched from normal drive to linear drive. However, different configurations (Case-II to Case-IV) yield similar results (~15keV) within measurement errors.

In summary,  we  have  presented  the  influence  of various  noise  sources  on  the  performance  of  a  sapphire bolometer in the CFDR  system  inclusive  of control, diagnostic  thermometry  and  DAQ.    It  is  shown  that  the presence of ground loops can worsen the bolometer resolution ~80%. Further, the noise pickups from vacuum pumps  and  gauges  also  introduce  thermal  load  on  the sensor. In the best configuration,  E~15keV is obtained for the sapphire bolometer at 15mK.

The  authors  would  like  to  thank TIN.TIN and  INO collaboration  for  their  support  and  Mr.  K.V.  Divekar  for assistance during measurements.

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A. Garai A. Reza A. Mazumdar H. Krishnamoorthy G. Gupta M. S. Pose S. Mallikarjunachary V. Nanal R. G. Pillay S. Ramakrishnan
Study of the effect of external noise pickups on the performance of a cryogenic bolometer
This paper reports the detailed noise characterization, investigation of
various noise sources and its mitigation to improve the performance of a
cryogenic bolometer detector. The noise spectrum has been measured for a
sapphire bolometer test setup with indigenously developed NTD Ge sensor in the
CFDR system at Mumbai. The effect of external noise, arising either from ground
loops in the system or from the diagnostic and control electronics of the
cryostat, on the performance of a cryogenic bolometer is assessed. A systematic
comparison of the influence of different noise pickups on the bolometer
resolution is also presented. The best-achieved resolution at 15mK is ~15 keV
for heater pulses and appears to be mainly limited by the noise due to the
pulse tube cryocooler.