II, Nonequilibrium Statistical Mechanics Springer, Berlin (1998). 

5 L. Landau and L. Lifshitz, Phys. Zeit. Sowjetunion 8 ,153 (1935). 6 

T. L. Gilbert, Armor Research Foundation Rep. No. 11 Chicago, IL. (1955). 7 

T. L. Gilbert, IEEE Trans. Mag. 40 , 3443 (2004). 8 

M. Fahnle, D. Steiauf, and J. Seib, J. Phys. D: Appl. Phys. 41 , 164014 (2008). 9 

E. Rossi, O.G. Heinonen, and A.H. MacDonald, Phys. Rev. B 72 , 174412 (2005). 10 

V. Kambersky, Phys. Rev. B 76 , 134416 (2007). 11 

I. Garate and A.H. MacDonald, Phys. Rev. B 79 , 064403 (2009). 12 

A. Brataas, Y. Tserkovnyak, and G.E.W. Bauer, Phys. Rev. Lett. 101 , 037207 (2008). 13 

K. Gilmore, Y.U. Idzerda, and M.D. Stiles, Phys. Rev. Lett. 99 , 027204 (2007). 14 

R.D. McMichael and A. Kunz, J. Appl. Phys. 91 , 8650 (2002). 15 

L. D. Landau and I. M. Khalatnikov, Dok. Akad. Navk SSSR 96 469, (1954). 16 

Y. Makita, I. Seo, and M. Sumita, J. Phys. Soc. Japan. 28 , 5268 (1970). 17 

K.Tani, J. Phys. Soc. Japan. 26 , 93 (1969). 18 

S. Sivasubramanian, A. Widom, and Y. N. Srivastava, Fer- roelectrics 300 , 43 (2004). 19 

H. Li, G. Subramanyam and J. Wang, Integrated Ferro- electrics 97 , 69 (2009). 20 

V. In, A. Palacions, A.R. Bulsara, P. Longhini, A. Kho, J. Neff, S. Baflio and B. Ando, Phys. Rev. E 73 , 066121 (2008). 21 

A. Gordon, Solid State Communications 147 , 201 (2008). 22 

S. Sivasubramanian, A. Widom, and Y. N. Srivastava, IEEE (UFFC) 50 , 950 (2003). 23 

H. Li and G. Subramanyam, IEEE Trans. on Ultrasonics, 

Ferroelectrics and Frequency Control 56 , 1861 (2009). 

24 D. Guyomar, B. Ducharorne and G. S´ebald, J. Phys. Appl. Phys. D 40 , 6048 (2007). 25 

B. And´ o, S. Baglio, A.R. Bulsara and V. Marletta, IEEE Trans. on Instrumentation and Measurements , (2009). DOI 10.1109/TIM.2009.2025081 26 

K. Yoshihisa, Y. Kaneko, H. Tanaka, K. Kaibara, S. Koyama, K. Isogai, T. Yamada and Y. Shimada, Jap. J. Appl. Phys. 46 , 2157 (2007). 27 

H. Kohlstedt, Y. Mustafa, A. Gerber, A. Petraru, M. Fit- silis, R. Meyer, U. Bttger and R. Waser, Microelectronic Engineering 80 , 296 (2005). 28 

L. Eun Sun, D. Jung, K. Young Min, K. Hyun Ho, H. Young Ki, J. Park, K. Seung Kuk, K. Jae Hyun, W. Hee San KIM and A. Woo Song, Jap. J. Appl. Phys. 47 , 2725 (2008). 29 

R. E. Jones, Jr. in the Custom Integrated Circuits Confer- ence, 1998, Proc. of the IEEE , 431 (1998). 30 

I. Vrejoiu, M. Alexe, D. Hesse and U. Gsele, J. Vac. Sci. & Tech. B: Microelectronics and Nanometer Structures 27 , 498 (2009). 31 

N. Inoue and Y. Hayashi, IEEE Trans. on Elect. Dev. 48 , 2266 (2001). 32 

T. Mikolajick, C. Dehm, W. Hartner, I. Kasko, M. Kast- ner, N. Nagel, M. Moert and C. Mazure, Microelectronics Reliability 41 , 947 (2001). 33 

C. Vittoria, S. D. Yoon and A. Widom, Phys. Rev. B 81 , 014412 (2010). 34 

L.D. Landau and E.M. Lifshitz, “ Electrodynamics of Con- tinuos Media ”, Pergamon Press, Oxford (1960). 35 

L.D. Landau and E.M. Lifshitz, “ Theory of Elasticity ”, Secs.10, 23 and 34, Pergamon Press, Oxford (1986). 36 

A.B. Bhatia, Ultrasonic Absorption , Oxford University Press, Oxford (1967). 

