But this approach of depositing spots of probe material directly on a flat substrate has many disadvantages. Apart from the patent protection on high probe densities, there is also a risk of adjacent probes contaminating each other, so that defect rates are high, and the process cannot easily be scaled up for high-volume production.
然而微陣列打點法的缺點不少，如探針數目受到專利保護、相鄰的探針有相互污染之虞，造成良率偏低，無法大量生產的缺點。