  The exploration of electronic and optoelectronic properties of
two-dimensional (2D) materials has become one of the most attractive line of
research since the isolation of graphene. Such 'all-surface materials' present
a strong sensitivity to environmental conditions and thus characterization of
the devices based on these materials usually requires measurement systems
operating in high-vacuum. However, conventional optoelectronic probe-station
testing systems are are not compatible with high vacuum operation and
vacuum-compatible versions are rather expensive. Here, we present a high-vacuum
system specifically designed to test electronic and optoelectronic devices
based on 2D materials. This system can be implemented with low budget and it is
mostly based on the assembly of commercially available standard vacuum and
optic components. Despite the simplicity of this system we demonstrate full
capabilities to characterize optoelectronic devices in a broad range of
wavelengths with fast pumping/venting speed and possibility of modulating the
device temperature (room temperature to ~150deg).

Applied Physics;Materials Science;Instrumentation and Detectors