  We propose a method using solid state detectors with directional sensitivity
to dark matter interactions to detect low-mass Weakly Interacting Massive
Particles (WIMPs) originating from galactic sources. In spite of a large body
of literature for high-mass WIMP detectors with directional sensitivity, no
available technique exists to cover WIMPs in the mass range <1 GeV. We argue
that single-electron resolution semiconductor detectors allow for directional
sensitivity once properly calibrated. We examine commonly used semiconductor
material response to these low-mass WIMP interactions.

Instrumentation and Detectors;Cosmology and Nongalactic Astrophysics;Materials Science;High Energy Physics - Experiment;Computational Physics