  The same charge sensitive preamplifier and discriminator circuit with
different isolation strategies has been tested to compare the isolation of both
analog and digital circuits from the substrate of a 65nm bulk CMOS process to
the isolation of only digital circuits, tying analog ground locally to the
substrate. This study will show that the circuit with analog on the substrate
and digital in deep N-well has better noise isolation between analog and
digital.

Instrumentation and Detectors;High Energy Physics - Experiment