  We characterise the performance of a surface-electrode ion "chip" trap
fabricated using established semiconductor integrated circuit and
micro-electro-mechanical-system (MEMS) microfabrication processes which are in
principle scalable to much larger ion trap arrays, as proposed for implementing
ion trap quantum information processing. We measure rf ion micromotion parallel
and perpendicular to the plane of the trap electrodes, and find that on-package
capacitors reduce this to <~ 10 nm in amplitude. We also measure ion trapping
lifetime, charging effects due to laser light incident on the trap electrodes,
and the heating rate for a single trapped ion. The performance of this trap is
found to be comparable with others of the same size scale.

Quantum Physics