  Ptychography involves a sample being illuminated by a coherent, localised
probe of illumination. When the probe interacts with the sample, the light is
diffracted and a diffraction pattern is detected. Then the probe or sample is
shifted laterally in space to illuminate a new area of the sample while
ensuring there is sufficient overlap. Far-field Ptychography occurs when there
is a large enough distance (when the Fresnel number is much greater than 1) to
obtain magnitude-square Fourier transform measurements. In an attempt to remove
ambiguities, masks are utilized to ensure unique outputs to any recovery
algorithm are unique up to a global phase. In this paper, we assume that both
the sample and the mask are unknown, and we apply blind deconvolutional
techniques to solve for both. Numerical experiments demonstrate that the
technique works well in practice, and is robust under noise.

Numerical Analysis;Numerical Analysis