  Among the existing elemental characterization techniques, Particle Induced
X-ray Emission (PIXE) and Energy Dispersive X-ray (EDX) spectroscopy are two of
the most widely used in different scientific and technological fields. Here we
present the first quantitative laser-driven PIXE and laser-driven EDX
experimental investigation performed at the Centro de L\'aseres Pulsados in
Salamanca. Thanks to their potential for compactness and portability,
laser-driven particle sources are very appealing for materials science
applications, especially for materials analysis techniques. We demonstrate the
possibility to exploit the X-ray signal produced by the co-irradiation with
both electrons and protons to identify the elements in the sample. We show
that, using the proton beam only, we can successfully obtain quantitative
information about the sample structure through laser-driven PIXE analysis.
These results pave the way towards the development of a compact and
multi-functional apparatus for the elemental analysis of materials based on a
laser-driven particle source.

Plasma Physics;Applied Physics;Instrumentation and Detectors