i i(xi) +X
i<j ij(xi;xj) (1)
 i(xi) =logpi(xi) (2)
 ij(xi;xj) =wp(xi6=xj)k(fifj) (3)
where iis the unary energy (negative log of the aggregated softmax probabilities) and  ijis the pairwise term
that connects every pair of pixels in the image. We use a
single pairwise term with a Potts label compatibility term
weighted by wpand unit Gaussian kernel k. For the featuresfi, we convert the RGB image to L*a*b*and use color
(IL
i;Ia
i;Ib
i)and position (px;py)as pairwise features for
each pixel: fi=h
px
i
pd;py
i
pd;IL
i
L;Ia
i
ab;Ib
i
abi
, wheredis the
smaller image dimension. Figure 4 shows an example unary
termpiand the resulting segmentation x.
5
Figure 5. Varying patch scale . We train/test patches of different
scales (the patch locations do not vary). The optimum is a trade-off
Recognizing materials in real-world images is a challenging task. Real-world
materials have rich surface texture, geometry, lighting conditions, and
clutter, which combine to make the problem particularly difficult. In this
paper, we introduce a new, large-scale, open dataset of materials in the wild,
the Materials in Context Database (MINC), and combine this dataset with deep
learning to achieve material recognition and segmentation of images in the
wild.
  MINC is an order of magnitude larger than previous material databases, while
being more diverse and well-sampled across its 23 categories. Using MINC, we
train convolutional neural networks (CNNs) for two tasks: classifying materials
from patches, and simultaneous material recognition and segmentation in full
images. For patch-based classification on MINC we found that the best
performing CNN architectures can achieve 85.2% mean class accuracy. We convert
these trained CNN classifiers into an efficient fully convolutional framework
combined with a fully connected conditional random field (CRF) to predict the
material at every pixel in an image, achieving 73.1% mean class accuracy. Our
experiments demonstrate that having a large, well-sampled dataset such as MINC
is crucial for real-world material recognition and segmentation.
Sean Bell Paul Upchurch Noah Snavely Kavita Bala