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Recent advances in X-ray computed tomography ( XCT ) have allowed for measurement resolutions approaching the point where XCT can be used for measuring surface topography .
 process characterization: X-ray computed tomography; process characterization: measurement; material: be; concept or principle: surface topography
Given options, please tell me the categories of all the listed entity words.Output format is "type1: word1; type2: word2". 
Option: manufacturing standard, machanical property, manufacturing process, material, engineering feature, process parameter, machine or equipment, application, process characterization, enabling technology, biomedical, concept or principle 
Text: {0} 
 Entities: X-ray computed tomography, measurement, be, surface topography 
Answer:
 process characterization: X-ray computed tomography; process characterization: measurement; material: be; concept or principle: surface topography