  (a) Scanning electron micrograph (SEM) of PAN tubular covering on SWNT.                         High-determination transmission electron micrograph (HR-TEM) of tubular covered Dish/SWNT tests; (b) at the beginning of electron bar presentation; (c and d1) demonstrate a territory of the PAN/SWNT test where the PAN grid of ~0.52 nm is watched; and (d2) a schematic featuring the PAN grid perceptions in (d1) 87.