This paper describes a novel planar near-field measurement system designed to test a beam-steered flat face phased array antenna. This system is unique in its ability to measure multiple beams during a single scan of the aperture. The system utilizes a very fast planar scanner with six foot by six foot of travel combined with fast beam-steering commands to significantly reduce the test time of multiple-beam phased array antennas. These features combined with software based on algorithms developed by the National Institute of Standards and Technology provide state of the art measurements of planar phased array antennas.