The electrochemical properties of amorphous vanadium pentoxide (V2O5) thin films deposited by reactive r.f.-sputtering were investigated using galvanostatic charge/discharge cycling and galvanostatic intermittent titration technique (GITT). As x in LixV2O5−y increased (x = 0–2.0), the electromotive force of the lithium (Li)∣1 M LiClO4–propylene carbonate∣LixV2O5−y cell decreased gradually without a potential plateau or an abrupt potential reduction, demonstrating that an irreversible structural change did not occur in the entire Li content. Chemical diffusivity of the Li ion in the LixV2O5−y thin film measured using GITT was determined to be 4 × 10−13–7 × 10−14 cm2 s−1 in the Li content range investigated.
