This paper describes the production of selenium sulfide (SeS2) crystalline thin film on commercial glass substrates, via chemical bath deposition. Transmittance, absorption, dielectric constant and refractive index of the produced films were investigated by UV/VIS Spectrum. It was found that changes occurred on the characteristics of the films and they were determined as a function of selenium sulfide concentration, which varied between 2 × 10−3 and 5 × 10−3 M. The structure of the film was analyzed using FTIR spectrum. The calculated refractive index values fell between 1.5 and 1.6, whereas the transmission ratio of the films was around 80–90%. Moreover, a peak in the reflectance was observed at 320–330 nm for all investigated samples. The highest dielectric constant for the films was obtained at the deposition concentration of 0.005 M. This study is believed to be useful for thin film production.
