X-ray analytical instrument manufacturer PANalytical has developed a new high-performance diffractometer. The Empyrean features a new X-ray source, goniometer, sample stages and radiation enclosure. Importantly, the instrument also introduces the world's first 3D detection system, PIXcel3D. It can measure powders, thin films, nanomaterials and 3D objects. Users can switch between application setups using the company's PreFIX modules. Empyrean says the diffractometer delivers accurate and quality data with powder samples and can measure thin films using high-resolution epitaxy analysis. With nanomaterials, it can measure the size and shape of crystalline domains within the material, and structural analysis of near amorphous materials are all possible. Empyrean also offers PDF (pair distribution function), SAXS (small angle X-ray scattering), and the ability to monitor the evolution of crystalline phases in situ using the slurry flow cell stage. Using PANalytical's diffractomer. The diffractometer also incorporates what the company says is the world's first 3D detection system, called PIXcel3D. It can be used as a CT scanner performing non-destructive analysis of structures such as pharmaceutical formulations, electronic components (batteries, ICs, capacitors) and geo- and archaeological samples. www.panalytical.com