Anomaly Location Detection with Electrical Impedance Tomography Using Multilayer Perceptrons
Electrical impedance tomography (EIT) does imaging by solving a nonlinear ill posed inverse problem. Recently, there has been an increasing interest in solving this problem with artificial neural networks. However, a systematic understanding of the optimal neural network architecture for this problem is still lacking. This paper compares the performance of different multilayer perceptron algorithms for detecting the location of an anomaly on a sensing surface by solving the EIT inverse problem. We generate synthetic data with varying anomaly sizes/locations and compare a wide range of multilayer perceptron algorithms by simulations. Our results indicate that increasing the dimensions of the perceptron improves performance, but this improvement saturates soon. The best performance is achieved when using the multilayer perceptron for regression and Gaussian noise addition as the regularization method.
2020 IEEE 30th International Workshop on Machine Learning for Signal Processing (MLSP)