A New Methodology for EMC Prediction of Integrated Circuits After Aging
Electromagnetic compatibility (EMC) of integrated circuits (ICs) represents a major constraint for the qualification of electronic circuits. Today, there exist standardized models such as integrated circuit emission model for conducted emissions (ICEM CE) that allows the prediction of conducted emission generated by an IC at a printed circuit board (PCB) level. However, the EMC levels may change after a certain period of operation due to the aging of components. On the other hand, no existing model or tool can predict the long term EMC levels. This paper presents a new methodology for modeling of ICs in order to construct an EMC model, which takes into account the aging based on a new reliability model called MultiphySics mulTistressOrs predictive Reliability Model (M STORM)
IEEE Transactions on Electromagnetic Compatibility