Line scan structured illumination microscopy super resolution imaging in thick fluorescent samples.
Structured illumination microscopy in thick fluorescent samples is a challenging task. The out of focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out of focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.
Optics express