Detecting faults in inner product masking scheme
Side channel analysis and fault injection attacks are two typical threats to cryptographic implementations, especially in modern embedded devices. Thus, there is an insistent demand for dual side channel and fault injection protections. As we know, masking is a kind of provable countermeasure against side channel attacks. Recently, inner product masking (IPM) was proposed as a promising higher order masking scheme against side channel analysis, but not for fault injection attacks. In this paper, we devise a new masking scheme named IPM FD. It is built on IPM, which enables fault detection. This novel masking scheme has three properties: the security orders in the word level probing model, bit level probing model and the number of detected faults. IPM FD is proven secure both in the word level and in the bit level probing models and allows for end to end fault detection against fault injection attacks. Furthermore, we illustrate its security order by interpreting IPM FD as a coding problem and then linking it to one defining parameters of linear code and show its implementation cost by applying IPM FD to AES 128.
Journal of Cryptographic Engineering