Advancements in technologies used for deeper analysis of artifacts were required, which has happened over the last twenty years. Hence, during "the last 20 years, a dramatic improvement in solid-state detectors technology has allowed new analytical applications".[1] Therefore, state of the art X-ray fluorescence spectrometers, a method of nondestructive testing, now typically exhibit improved deconstruction capabilities resulting in more accurately resolving the chemical composition of targeted artifacts into data that describes their constituent elements.