BAFLineDP: Code Bilinear Attention Fusion Framework for Line-Level Defect Prediction
<|reference_start|>BAFLineDP: Code Bilinear Attention Fusion Framework for Line-Level Defect Prediction: Software defect prediction aims to identify defect-prone code, aiding developers in optimizing testing resource allocation. Most defect prediction approaches primarily focus on coarse-grained, file-level defect prediction, which fails to provide developers with the precision required to locate defective code. Recently, some researchers have proposed fine-grained, line-level defect prediction methods. However, most of these approaches lack an in-depth consideration of the contextual semantics of code lines and neglect the local interaction information among code lines. To address the above issues, this paper presents a line-level defect prediction method grounded in a code bilinear attention fusion framework (BAFLineDP). This method discerns defective code files and lines by integrating source code line semantics, line-level context, and local interaction information between code lines and line-level context. Through an extensive analysis involving within- and cross-project defect prediction across 9 distinct projects encompassing 32 releases, our results demonstrate that BAFLineDP outperforms current advanced file-level and line-level defect prediction approaches.<|reference_end|>
@article{qiu2024baflinedp:,
    title={BAFLineDP: Code Bilinear Attention Fusion Framework for Line-Level
  Defect Prediction},
    author={Shaojian Qiu, Huihao Huang, Jianxiang Luo, Yingjie Kuang, Haoyu Luo},
    journal={arXiv preprint arXiv:2402.07132},
    year={2024},
    archivePrefix={arXiv},
    eprint={2402.07132},
    primaryClass={cs.SE}
}