OAML: Outlier Aware Metric Learning for OOD Detection Enhancement
<|reference_start|>OAML: Outlier Aware Metric Learning for OOD Detection Enhancement: Out-of-distribution (OOD) detection methods have been developed to identify objects that a model has not seen during training. The Outlier Exposure (OE) methods use auxiliary datasets to train OOD detectors directly. However, the collection and learning of representative OOD samples may pose challenges. To tackle these issues, we propose the Outlier Aware Metric Learning (OAML) framework. The main idea of our method is to use the k-NN algorithm and Stable Diffusion model to generate outliers for training at the feature level without making any distributional assumptions. To increase feature discrepancies in the semantic space, we develop a mutual information-based contrastive learning approach for learning from OOD data effectively. Both theoretical and empirical results confirm the effectiveness of this contrastive learning technique. Furthermore, we incorporate knowledge distillation into our learning framework to prevent degradation of in-distribution classification accuracy. The combination of contrastive learning and knowledge distillation algorithms significantly enhances the performance of OOD detection. Experimental results across various datasets show that our method significantly outperforms previous OE methods.<|reference_end|>
@article{gao2024oaml:,
    title={OAML: Outlier Aware Metric Learning for OOD Detection Enhancement},
    author={Heng Gao, Zhuolin He, Shoumeng Qiu, Jian Pu},
    journal={arXiv preprint arXiv:2406.16525},
    year={2024},
    archivePrefix={arXiv},
    eprint={2406.16525},
    primaryClass={stat.ML cs.LG}
}