Segment Anything Model for Grain Characterization in Hard Drive Design
<|reference_start|>Segment Anything Model for Grain Characterization in Hard Drive Design: Development of new materials in hard drive designs requires characterization of nanoscale materials through grain segmentation. The high-throughput quickly changing research environment makes zero-shot generalization an incredibly desirable feature. For this reason, we explore the application of Meta's Segment Anything Model (SAM) to this problem. We first analyze the out-of-the-box use of SAM. Then we discuss opportunities and strategies for improvement under the assumption of minimal labeled data availability. Out-of-the-box SAM shows promising accuracy at property distribution extraction. We are able to identify four potential areas for improvement and show preliminary gains in two of the four areas.<|reference_end|>
@article{nichols2024segment,
    title={Segment Anything Model for Grain Characterization in Hard Drive Design},
    author={Kai Nichols, Matthew Hauwiller, Nicholas Propes, Shaowei Wu, Stephanie
  Hernandez, Mike Kautzky},
    journal={arXiv preprint arXiv:2408.12732},
    year={2024},
    archivePrefix={arXiv},
    eprint={2408.12732},
    primaryClass={cs.CV cond-mat.mtrl-sci cs.LG}
}