Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
<|reference_start|>Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy: Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not only takes a lot of instrument and operator time, but also often leads to frequent probe and sample damage, poor image quality and reproducibility issues for new types of samples or inexperienced users. Despite wide use, optimization of tapping mode imaging is an extremely hard problem, ill-suited to either classical control methods or machine learning. Here we introduce a reward-driven workflow to automate the optimization of SPM in the tapping mode. The reward function is defined based on multiple channels with physical and empirical knowledge of good scans encoded, representing a sample-agnostic measure of image quality and imitating the decision-making logic employed by human operators. This automated workflow gives optimal scanning parameters for different probes and samples and gives high-quality SPM images consistently in the attractive mode. This study broadens the application and accessibility of SPM and opens the door for fully automated SPM.<|reference_end|>
@article{liu2024machine,
    title={Machine Learning-Based Reward-Driven Tuning of Scanning Probe
  Microscopy: Towards Fully Automated Microscopy},
    author={Yu Liu, Roger Proksch, Jason Bemis, Utkarsh Pratiush, Astita Dubey,
  Mahshid Ahmadi, Reece Emery, Philip D. Rack, Yu-Chen Liu, Jan-Chi Yang,
  Sergei V. Kalinin},
    journal={arXiv preprint arXiv:2408.04055},
    year={2024},
    archivePrefix={arXiv},
    eprint={2408.04055},
    primaryClass={cond-mat.mes-hall cond-mat.mtrl-sci cs.AI cs.LG}
}