Enhanced Feature Based Granular Ball Twin Support Vector Machine
<|reference_start|>Enhanced Feature Based Granular Ball Twin Support Vector Machine: In this paper, we propose enhanced feature based granular ball twin support vector machine (EF-GBTSVM). EF-GBTSVM employs the coarse granularity of granular balls (GBs) as input rather than individual data samples. The GBs are mapped to the feature space of the hidden layer using random projection followed by the utilization of a non-linear activation function. The concatenation of original and hidden features derived from the centers of GBs gives rise to an enhanced feature space, commonly referred to as the random vector functional link (RVFL) space. This space encapsulates nuanced feature information to GBs. Further, we employ twin support vector machine (TSVM) in the RVFL space for classification. TSVM generates the two non-parallel hyperplanes in the enhanced feature space, which improves the generalization performance of the proposed EF-GBTSVM model. Moreover, the coarser granularity of the GBs enables the proposed EF-GBTSVM model to exhibit robustness to resampling, showcasing reduced susceptibility to the impact of noise and outliers. We undertake a thorough evaluation of the proposed EF-GBTSVM model on benchmark UCI and KEEL datasets. This evaluation encompasses scenarios with and without the inclusion of label noise. Moreover, experiments using NDC datasets further emphasize the proposed model's ability to handle large datasets. Experimental results, supported by thorough statistical analyses, demonstrate that the proposed EF-GBTSVM model significantly outperforms the baseline models in terms of generalization capabilities, scalability, and robustness. The source code for the proposed EF-GBTSVM model, along with additional results and further details, can be accessed at https://github.com/mtanveer1/EF-GBTSVM.<|reference_end|>
@article{quadir2024enhanced,
    title={Enhanced Feature Based Granular Ball Twin Support Vector Machine},
    author={A. Quadir, M. Sajid, Mushir Akhtar, M. Tanveer, P. N. Suganthan},
    journal={27th International Conference on Pattern Recognition (ICPR), 2024},
    year={2024},
    archivePrefix={arXiv},
    eprint={2410.05786},
    primaryClass={cs.LG}
}