Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization
<|reference_start|>Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization: Physical imaging is a foundational characterization method in areas from condensed matter physics and chemistry to astronomy and spans length scales from atomic to universe. Images encapsulate crucial data regarding atomic bonding, materials microstructures, and dynamic phenomena such as microstructural evolution and turbulence, among other phenomena. The challenge lies in effectively extracting and interpreting this information. Variational Autoencoders (VAEs) have emerged as powerful tools for identifying underlying factors of variation in image data, providing a systematic approach to distilling meaningful patterns from complex datasets. However, a significant hurdle in their application is the definition and selection of appropriate descriptors reflecting local structure. Here we introduce the scale-invariant VAE approach (SI-VAE) based on the progressive training of the VAE with the descriptors sampled at different length scales. The SI-VAE allows the discovery of the length scale dependent factors of variation in the system. Here, we illustrate this approach using the ferroelectric domain images and generalize it to the movies of the electron-beam induced phenomena in graphene and topography evolution across combinatorial libraries. This approach can further be used to initialize the decision making in automated experiments including structure-property discovery and can be applied across a broad range of imaging methods. This approach is universal and can be applied to any spatially resolved data including both experimental imaging studies and simulations, and can be particularly useful for exploration of phenomena such as turbulence, scale-invariant transformation fronts, etc.<|reference_end|>
@article{raghavan2024invariant,
    title={Invariant Discovery of Features Across Multiple Length Scales:
  Applications in Microscopy and Autonomous Materials Characterization},
    author={Aditya Raghavan, Utkarsh Pratiush, Mani Valleti, Richard Liu, Reece
  Emery, Hiroshi Funakubo, Yongtao Liu, Philip Rack, Sergei Kalinin},
    journal={arXiv preprint arXiv:2408.00229},
    year={2024},
    archivePrefix={arXiv},
    eprint={2408.00229},
    primaryClass={physics.comp-ph cond-mat.mtrl-sci cs.LG physics.app-ph}
}