Shape-Optimized Electrooptic Beam Scanners: Experiment
<|reference_start|>Shape-Optimized Electrooptic Beam Scanners: Experiment: A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam. An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.<|reference_end|>
@article{fang2024shape-optimized,
    title={Shape-Optimized Electrooptic Beam Scanners: Experiment},
    author={Jennifer C. Fang, M. J. Kawas, J. Zou, V. Gopalan, T. E. Schlesinger,
  Daniel D. Stancil},
    journal={IEEE Photonics Technology Letters ( Volume: 11, Issue: 1, January
  1999)},
    year={2024},
    doi={10.1109/68.736393},
    archivePrefix={arXiv},
    eprint={2405.05540},
    primaryClass={cs.NI cs.AR}
}