Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement
<|reference_start|>Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement: A fundamental tenet of pattern recognition is that overlap between training and testing sets causes an optimistic accuracy estimate. Deep CNNs for face recognition are trained for N-way classification of the identities in the training set. Accuracy is commonly estimated as average 10-fold classification accuracy on image pairs from test sets such as LFW, CALFW, CPLFW, CFP-FP and AgeDB-30. Because train and test sets have been independently assembled, images and identities in any given test set may also be present in any given training set. In particular, our experiments reveal a surprising degree of identity and image overlap between the LFW family of test sets and the MS1MV2 training set. Our experiments also reveal identity label noise in MS1MV2. We compare accuracy achieved with same-size MS1MV2 subsets that are identity-disjoint and not identity-disjoint with LFW, to reveal the size of the optimistic bias. Using more challenging test sets from the LFW family, we find that the size of the optimistic bias is larger for more challenging test sets. Our results highlight the lack of and the need for identity-disjoint train and test methodology in face recognition research.<|reference_end|>
@article{wu2024identity,
    title={Identity Overlap Between Face Recognition Train/Test Data: Causing
  Optimistic Bias in Accuracy Measurement},
    author={Haiyu Wu, Sicong Tian, Jacob Gutierrez, Aman Bhatta, Kau{g}an
  "Ozt"urk, Kevin W. Bowyer},
    journal={arXiv preprint arXiv:2405.09403},
    year={2024},
    archivePrefix={arXiv},
    eprint={2405.09403},
    primaryClass={cs.CV}
}