Compact and De-biased Negative Instance Embedding for Multi-Instance Learning on Whole-Slide Image Classification
<|reference_start|>Compact and De-biased Negative Instance Embedding for Multi-Instance Learning on Whole-Slide Image Classification: Whole-slide image (WSI) classification is a challenging task because 1) patches from WSI lack annotation, and 2) WSI possesses unnecessary variability, e.g., stain protocol. Recently, Multiple-Instance Learning (MIL) has made significant progress, allowing for classification based on slide-level, rather than patch-level, annotations. However, existing MIL methods ignore that all patches from normal slides are normal. Using this free annotation, we introduce a semi-supervision signal to de-bias the inter-slide variability and to capture the common factors of variation within normal patches. Because our method is orthogonal to the MIL algorithm, we evaluate our method on top of the recently proposed MIL algorithms and also compare the performance with other semi-supervised approaches. We evaluate our method on two public WSI datasets including Camelyon-16 and TCGA lung cancer and demonstrate that our approach significantly improves the predictive performance of existing MIL algorithms and outperforms other semi-supervised algorithms. We release our code at https://github.com/AITRICS/pathology_mil.<|reference_end|>
@article{lee2024compact,
    title={Compact and De-biased Negative Instance Embedding for Multi-Instance
  Learning on Whole-Slide Image Classification},
    author={Joohyung Lee, Heejeong Nam, Kwanhyung Lee, Sangchul Hahn},
    journal={arXiv preprint arXiv:2402.10595},
    year={2024},
    archivePrefix={arXiv},
    eprint={2402.10595},
    primaryClass={cs.CV}
}