title: Lijst van analysemethoden voor materialen
text: Dit is een lijst van karakteriserings- en analysemethoden voor materialen en hun structuren. De technieken zijn essentieel in het vakgebied der materiaalkunde, maar worden ook veel toegepast in de vastestoffysica en analytische chemie. De analysemethoden worden weergegeven op basis van hun acroniem, indien aanwezig, en staan op alfabetische volgorde. Synoniemen zijn aangegeven en analysemethoden, die alleen als toevoeging op een andere methode mogelijk zijn, zijn aangegeven met "zie hoofdtechniek".
  
  A 
  
   AAS –  Atomaire-absorptiespectrometrie
   AED – Auger-elektrondiffractie
   AES – Auger-elektronspectroscopie
   AES – Atomaire emissie spectroscopie, synoniem met OES
   AFM –  Atoomkrachtmicroscopie
   AFS of FCM – Fluorescentiespectroscopie
   APFIM – Atom probe field ion microscopie
   APS – Appearance potential spectroscopie
   ARPES – Angle resolved photoemission spectroscopie, synoniem met ARUPS
   ARUPS – Angle resolved ultraviolet photoemission spectroscopie
   ATR – Attenuatie van de totale reflectie
   AUC – Analytische ultracentrifugatie
  
  B 
  
   BET – BET surface area measurement (BET van Brunauer, Emmett, Teller)
   BiFC – Bimolecular fluorescence complementation
   BKD – Backscatter Kikuchi diffraction, zie EBSD
   BRET – Förster resonance energy transfer
   BSED – Back scattered electron diffraction, synoniem van EBSD
  
  C 
  
   CAICISS – Coaxial impact collision ion scattering spectroscopie
   CARS – Coherent anti-Stokes Ramanspectroscopie
   CBED – Convergent beam electron diffraction
   CCM – Charge collection microscopie, zie EM
   CDI – Coherent diffraction imaging
   CE – Capillaire elektroforese
   CET – Cryo-elektronentomografie, ET
   CL – Kathodeluminescentie
   CLSM – Confocal laser scanning microscopie
   COSY – Correlatie spectroscopie
   CR – Cyclotron resonance
   Cryo-EM – Cryo-elektronenmicroscopie, zie EM
   Cryo-SEM – Cryo-rasterelektronenmicroscopie, zie SEM
   CV – Cyclovoltammetrie
  
  D 
  
   DDC – Dynamische differentiecalorimetrie
   DE(T)A – Diëlektrische thermische analyse
   dHvA – De Haas–van Alphen-analyse
   DIC – Differentiële interferentiecontrastmicroscopie
   Diëlektrische spectroscopie
   DLS – Dynamische lichtverstrooiing
   DLTS – Transiënte spectroscopie op diep niveau
   DMA, DMTA of DTMA – Dynamisch-mechanische analyse of dynamische thermo-mechanische analyse
   DPI – Interferometrie met dubbele polarisatie
   DRS – Diffuse reflectiespectroscopie
   DSC – Dynamische differentiecalorimetrie
   DTA – Differentiële thermische analyse
   DVS – Dynamische dampsorptie
  
  E 
  
   EBIC – Electron beam induced current, zie IBIC
   EBS – Elastische (niet-Rutherford) backscattering spectrometrie, zie RBS
   EBSD – Electron backscatter diffraction
   ECOSY – Exclusive correlation spectroscopie
   ECT – Electrical capacitance tomography
   EDAX – Energy-dispersive analysis of x-rays
   EDMR – Electrically detected magnetic resonance, zie ESR of EPR
   EDS of EDX – Energy dispersive X-ray spectroscopie, zie SEM
   EELS – Elektronen energieverlies spectroscopie
   EFM – Electrostatic force microscopy
   EF-TEM – Energy filtered transmission electron microscopie, zie TEM
   EID – Electron induced desorption
   EIT en ERT – Elektrische impedantie-tomografie en elektrische weerstand tomografie
   EIS –  Elektrochemische impedantie-spectroscopie
   EL – Elektroluminescentie
   Ellipsometrie
   Elektronenkristallografie
   ELS – Electrophoretic light scattering
   EM – Elektronenmicroscopie
   ENDOR – Electron nuclear double resonance, zie ESR
   EPMA – Elektronensonde-microanalyse of elektronenmicrosonde, zie SEM
   EPR – Elektron paramagnetische resonantie spectroscopie, zie ESR
   ERD of ERDA – Elastic recoil detection of elastic recoil detection analysis
   ESCA – Elektronenspectroscopie voor chemische analyse, zie XPS
   ESD – Electron stimulated desorption
   ESEM – Environmental scanning elektronenmicroscopie, zie SEM
   ESI-MS of ES-MS – Elektrospray-ionisatie massaspectrometrie of elektrospray massaspectrometrie
   ESR – Elektronspinresonantie-spectroscopie
   ESTM – Electrochemical scanning tunneling microscopie
   ET – Elektronentomografie
   EXAFS – Extended X-ray absorption fine structure
   EXSY – Exchange spectroscopie
  
  F 
  
   FCS – Fluorescentie correlatie spectroscopie
   FCCS – Fluorescence cross-correlation spectroscopy
   FEM – Field emission microscopy
   FIB – Focused ion beam microscopy
   FIM-AP – Field ion microscopy–atom probe
   Flow birefringence
   Fluorescence anisotropy
   FLIM – Fluorescence lifetime imaging
   FCM – Fluorescentiemicroscopie
   FOSPM – Feature-oriented scanning probe microscopy, zie SPM
   FRET – Förster resonance energy transfer
   FRS – Forward Recoil Spectrometry, synoniem van ERD
   FTICR – Fourier-transform ion cyclotron resonance, zie CR
   FT-MS – Fourier-transform massaspectrometrie, zie MS
   FTIR – Fourier-transform infraroodspectroscopie, zie IR
  
  G 
  
   GC – Gaschromatografie
   GC-MS – Gaschromatographie-massaspectrometrie, zie GC
   GDMS – Glow discharge mass spectrometry
   GDOS – Glow discharge optical spectroscopy
   GISAXS – Grazing incidence small angle X-ray scattering
   GIXD – Grazing incidence X-ray diffraction
   GIXR – Grazing incidence X-ray reflectivity
   GLC – Gas-vloeistofchromatografie, zie GC
  
  H 
  
   HAADF – High angle annular dark-field imaging
   HAS – Helium atom scattering
   HPLC – High performance liquid chromatography
   HREELS of HEELS – High resolution electron energy loss spectroscopy, zie EELS
   HREM – High-resolution electron microscopy
   HRTEM – High-resolution transmission electron microscopy
   HI-ERDA – Heavy-ion elastic recoil detection analysis
   HE-PIXE – High-energy proton induced X-ray emission
  
  l 
  
   IAES – Ion induced Auger electron spectroscopy, zie AES
   IBA – Ionenbundelanalyse
   IBIC – Ion beam induced charge microscopie
   ICP-AES – Inductively coupled plasma atomic emission spectroscopy
   ICP-MS – Inductief gekoppelde plasmamassaspectrometrie 
   ICR – Ion cyclotron resonance
   IETS – Inelastic electron tunneling spectroscopy
   IGA – Intelligent gravimetric analysis
   IGF – Inert gas fusion
   IIX – Ion induced X-ray analysis, zie PIXE
   Immunofluorescentiemicroscopie, zie FCM
   INS – Ion neutralization spectroscopy
   Inelastic neutron scattering
   IRNDT – Infrared non-destructive testing of materials
   IRR – Infraroodreflectografie
   IRS – Infraroodspectroscopyie
   ISS – Ion scattering spectroscopy
   ITC – Isothermal titration calorimetry
   IVEM – Intermediate voltage electron microscopy, zie EM
  
  L 
  
   LALLS – Low-angle laser light scattering
   LC – Vloeistofchromatografie
   LC-MS – Vloeistof chromatografie-massaspectrometrie, zie LC
   LEED – Laagenergetische elektrondiffractie
   LEEM – Lage-energie elektronenmicroscopie
   LEIS – Lage-energie ionenverstrooiing
   LFM – Lateral force microscopy
   LIBS – Laser induced breakdown spectroscopy
   LOES – Laser optical emission spectroscopy
   LS – Licht(Raman)verstrooiing of Ramanverstrooiing
  
  M 
  
   MALDI – Matrix-assisted laser desorption/ionization
   MBE – Molecular beam epitaxy
   MEIS – Medium energy ion scattering
   MFM – Magnetic force microscopy
   MIT – Magnetic induction tomography
   MPM – Multiphoton fluorescence microscopy
   MRFM – Magnetic resonance force microscopy
   MRI – Magnetic resonance imaging
   MS – Massaspectrometrie
   MS/MS – Tandem mass spectrometry, zie MS
   MSGE – Mechanically stimulated gas emission
   Mössbauerspectroscopie
   MTA – Microthermische analyse
  
  N 
  
   NAA – Neutronenactiveringsanalyse
   ND – Neutronendiffractie
   NDP – Neutron depth profiling
   NEXAFS – Near edge X-ray absorption fine structure, synoniem van XANES
   NIS – Nuclear inelastic scattering/absorption
   NMR – Kernspinresonantie-spectroscopie
   NOESY – Nuclear Overhauser effect spectroscopy
   NRA – Nuclear reaction analysis
   NSOM – Near-field optical microscopy
  
  O 
  
   OBIC – Optical beam induced current
   ODNMR – Optically detected magnetic resonance, zie ESR
   OES – Optische emissie spectroscopie, synoniem met AES
   OM – Optische microscopie
   OM-TL – Optische microscopie met transmissie licht, zie OM
   OM-RL – Optische microscopie met gereflecteerd licht, zie OM
   Osmometry
  
  P 
  
   PAS – Positron annihilation spectroscopy
   Fotoacoustic spectroscopie
   PAT of PACT – Fotoacoustische tomographie of photoacoustic computed tomography
   PAX – Fotoemissie van geadsorbeerde xenon
   PC of PCS – Photocurrent spectroscopy
   Fasecontrastmicroscopie
   PhD – Fotoelektronendiffractie
   PD – Photodesorption
   PDEIS – Potentiodynamic electrochemical impedance spectroscopy
   PDS – Photothermal deflection spectroscopy
   PED – Photoelectron diffraction
   PEELS – Parallel elektronen energieverlies spectroscopie, zie EELS
   PEEM – Fotoemissie elektronenmicroscopie of fotoelektron emissie microscopie
   PES – Fotoelektronenspectroscopie
   PINEM – photon-induced near-field electron microscopy
   PIGE – Particle (or proton) induced gamma-ray spectroscopy, zie nuclear reaction analysis
   PIXE – Particle (or proton) induced X-ray spectroscopy
   PL – Fotoluminescentie
   Porosimetrie
   Poederdiffractie
   PTMS – Photothermal microspectroscopy
   PTS – Photothermal spectroscopy
  
  Q 
  
   QENS – Quasielastic neutron scattering
   QCM-D – Quartz crystal microbalance with dissipation monitoring
  
  R 
  
   RS – Ramanspectroscopie
   RAXRS – Resonant anomalous X-ray scattering
   RBS – Rutherford backscattering spectrometrie
   REM – Reflectie-elektronenmicroscopie, zie EM
   RDS – Reflectance difference spectroscopy
   RHEED – Reflection high-energy electron diffraction
   RIMS – Resonance ionization mass spectrometry
   RIXS – Resonant inelastic X-ray scattering
   RR spectroscopy – Resonantie Ramanspectroscopie
  
  S 
  
   SAD – Selected area diffraction
   SAED – Selected area electron diffraction
   SAM – Scanning Auger microscopy, zie AES
   SANS – Small-angle neutron scattering
   SAXS – Small-angle X-ray scattering
   SCANIIR – Surface composition by analysis of neutral species en ion-impact radiation
   SCEM – Scanning confocal electron microscopy
   SCM – Scanning capacitance microscopy
   SE – Spectroscopische ellipsometrie, zie ellipsometrie
   SEC – Size exclusionchromatografie
   SEIRA – Surface enhanced infrared absorption spectroscopy
   SEM – rasterelektronenmicroscopie, scanning electron microscopy
   SEI – Secondaire elektron imaging, zie SEM
   SERS – Surface enhanced Raman spectroscopy
   SERRS – Surface enhanced resonance Raman spectroscopy
   SESANS – Spin Echo Small Angle Neutron Scattering
   SEXAFS – Surface extended X-ray absorption fine structure
   SICM – Scanning ion-conductance microscopy
   SIL – Solid immersion lens
   SIM – Solid immersion mirror
   SIMS – Secondary ion mass spectrometry
   SNMS – Sputtered neutral species mass spectrometry
   SNOM – Scanning near-field optical microscopy
   SPECT – Single-photon emission computed tomography-scan
   SPM – Scanning probe microscopy
   SRM-CE/MS – Selected-reaction-monitoring capillaire elektroforese massaspectrometrie
   SSNMR – Solid-state nuclear magnetic resonance
   Starkeffect-spectroscopie
   STED – Stimulated emission depletion microscopy
   STEM – Scanning transmission electron microscopy, zie TEM
   STM – Scanning tunneling microscopy
   STS – Scanning tunneling spectroscopy
   SXRD – Surface X-ray diffraction, zie XRD
  
  T 
  
   TAT of TACT – Thermoacoustisch tomografie of thermoacoustic computed tomography, zie PAT
   TEM – Transmissie-elektronenmicroscopie
   TGA – Thermogravimetric analysis
   TIKA – Transmitting ion kinetic analysis
   TIMS – Thermische ionisatie massaspectrometrie
   TIRFM – Totale interne reflectie fluorescentie microscopie
   TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
   TMA – Thermo-mechanische analyse
   TOF-MS – Time-of-flight mass spectrometry
   TPEF of 2PEF – Two-photon excitation microscopy
   TXRF – Totale reflectie röntgenfluorescentie analyse, zie XRF
  
  U 
  
   Ultrasound attenuation spectroscopy
   UPS – UV-fotoelektron spectroscopie
   USANS – Ultra small-angle neutron scattering
   USAXS – Ultra small-angle X-ray scattering
   UT – Ultrasoon onderzoek
   UV/Vis – Ultraviolet/visible-spectroscopie
  
  V 
  
   VEDIC – Video-enhanced differential interference contrast microscopy
   Voltammetrie
  
  W 
  
   WAXS – Wide angle X-ray scattering
   WDX of WDS – Wavelength dispersive X-ray spectroscopy
  
  X 
  
   XAES – Röntgen geïnduceerde Auger-elektronspectroscopie, zie AES
   XANES – X-ray absorption fine structure, synoniem van NEXAFS
   XAS – Röntgenabsorptie-spectroscopie
   X-CTR – X-ray crystal truncation rod verstrooiing
   Röntgenkristallografie
   XDS – Röntgen diffuse verstrooiing
   XPEEM – Röntgen fotoelektron emissie microscopie
   XPS – Röntgenfotoelektron-spectroscopie
   XRD – Röntgendiffractie
   XRES – X-ray resonant exchange scattering
   XRF – Röntgenfluorescentiespectrometrie
   XRR – Röntgenreflectiviteit
   XRS – Röntgen Raman verstrooiing
   XSW – Röntgen staande golf techniek
  
  Symbolen 
   μSR – zie muon-spinspectroscopie
   χ – zie magnetische susceptibiliteit
  
  Zie ook 
  
   Materiaalkarakterisering
   Thermische analyse
   Structuuranalyse en vibratiespectroscopie
   Elementanalyse
  
  Literatuur 
  
   
   
  Wetenschapslijsten
  Analytische chemie
  Vastestoffysica
  Materiaaltesten