He completed his PhD in Materials Science at the University of Tokyo in 2011. Following his postdoctoral position at the University of Tokyo, he moved to Oak Ridge National Laboratory in USA from 2012 to 2014, and he then joined the University of Tokyo in the current position. His research interests are in the development of atomic-resolution scanning transmission electron microscopy (STEM) including single electron sensitive quantitative STEM imaging, dynamic STEM for single atom tracking, three-dimensional optical depth sectioning with large-angle illumination, and atomic and electronic structure analysis in materials science such as lithium ion battery materials, functional nitride and oxide materials. He received Albert Crewe Award from Microscopy Society of America in 2016 and Encouragement Prize from The Japanese Society of Microscopy.