Prior to joining the University of Rochester faculty, he studied at the Delft University of Technology in the Netherlands where he received his Ph.D. in 2010, and the University of North Carolina at Charlotte where he received his M.Sc. in 2007 and B.S. in 2005, all in Mechanical Engineering. Jonâ€™s background is in building novel instruments to enhance metrology capabilities for improving manufacturing processes and he is currently building a research group centered on precision engineering and optical metrology. Jon's current research topics include high power laser stabilization, multi-axis interferometry, and miniaturized displacement interferometers. Jon has authored or co-authored more than 20 technical papers, holds 3 patents, and is an active participant in many professional societies, including ASPE, euspen, SPIE, and OSA.