area of the sample surface is smaller than the measurement area which is seen by the light detector this arrangement allows the sample surface to change its position within the geometrical limits the measurement area of the beam remains within the detection area of the light detector as the sample surface moves the intensity of reflected light received by the light detector is compared with known values of intensity for various gloss sample surfaces based on the area of the beam of light the various embodiments described herein may comply with various known standards for example the technical association of the pulp and paper industry tappi standards as well as other known industry and government standards referring to fig2 sensor 200 may include light source 202 for providing light beam 204 to illuminate sample surface 206 at a pass line light source 202 provides light beam 204 with an area larger than light detection surface 210 of light detector 208 light source 202 provides a focused beam of light or collimated light beam for example a laser or other method of providing a focused beam of light light source 202 may be a variety of electromagnetic energy sources for example the light source may emit a non visible wavelength of light energy to prevent interference by overhead lighting or other sources of light within the manufacturing process sample surface 206 may be a variety of materials handled in a manufacturing process or mechanized.