the contact pins which presses the electric part when the latch is closed and is in a state the electric part can be accommodated and taken out when the latch is opened and an operating member vertically movably disposed in the socket body and has an operating portion for opening constituted so as to press down an operation portion to be operated for opening formed to the latch and rotate the latch in an opening direction when the operating member descends an outermost position of the latch is disposed on an inside of outermost portion of the contact pins when the latch is opened to an outermost position application_number US 201213713303 A description fig1 to 15 represent one embodiment of the present invention structure or configuration of the present embodiment will be first described hereunder in which reference numeral 11 denotes an ic socket as u201c socket for electric parts u201d and the ic socket 11 is disposed on a circuit board not shown and is a component for establishing an electric connection between terminals 12 b of an ic package 12 as the u201c electric parts u201d and the circuit board for the purpose of performing burn in test or like of the ic package and the like the ic package 12 has a package body 12 a having a rectangular shape in a plan view as shown in fig1 and a plurality of terminals 12 b are disposed to four sides of the lower surface of the peripheral edge of the package.