command stack it supplies the sensitivity value to the current measurement device 58 which responds by adjusting its sensitivity to the specified value and it supplies the cut off frequency to the filter 74 the sampling rate to the sampling pulse generator and the current level to the power supply amplifier in the case of a dynamic current measurement the sequencer exercises the dut through a loop of patterns and the trigger is generated either in the loop or before the loop is entered the start delay is selected to ensure that the current measurement device will be ready to make measurements when the dut is in the desired state relative to the loop i e in the loop and possibly also just before entering the loop when the dut is exercised through a sequence of patterns the current drawn by the dut is generally much higher than the quiescent current as explained above in order to supply the necessary high current the power supply amplifier is switched to its high current mode because the current is high the sensitivity of the current measurement device is set to a lower value than would normally be used in a quiescent current measurement further because of the high frequency of the dynamic current the filter cut off frequency is generally much lower for a dynamic current measurement than for a quiescent current measurement the sampling rate is selected on the basis of the cut off frequency of the filter 74 a quiescent current measurement can be performed using the dps shown in fig3 in essentially the same manner as that described with reference to fig2 the current level is set to the low level sensitivity is set high and the sampling rate and cut off frequency are low other quasi autonomous.