ue8a0 tan ue89e ue89e h ue89e ue89e u03c8 ue89e ue89e u03b2 tan ue89e ue89e h ue89e ue89e u03c8 ue89e ue89e u03b2 1 cos 2 ue89e ue89e u03c8 ue8a0 u03b2 ue89e ue89e u03b2 1 ue89e ue89e tan ue89e ue89e u03c8 b s ue89e ue89e u03c9 ue89e ue89e cos ue89e ue89e h 2 ue89e ue89e u03c8 eq ue89e ue89e 11 u03c8 ue89e ue89e u03c9 ue89e ue89e u03c4 f 2 e q ue89e ue89e 12 the structure of a thermophysical property microscope according to one embodiment of the present invention will now be described with reference to fig2 x y stage 1 is able to translate two dimensionally and it also has micrometer 2 for vertical translation with precise adjustment specimen 3 is placed on x y stage 1 and the vertical positioning of the stage is adjusted so that laser beams are focused at the surface of the specimen heating laser beam 5 and probe laser beam 6 are combined and impinged on to the surface of specimen 3 through microscopic optics 4 heating laser system 7 such as 514 5 nm cw ar laser system produces heating laser beam 5 and modulator 8 modulates the beam probe laser beam system 9 such as cw helium neon laser system produces probe laser beam 6 driver 10 drives modulator 8 with a fixed frequency generated by function generator 11 to modulate.