turns on snaps back and clamps the voltage to 14v point c after every single test point between b and c a leakage test is performed and is shown in b u2032 c u2032 region of the dotted line the leakage current doesn 39 t change remains around 1e u2212 9 indicating the device or structure is still functional points c to d in the solid line correspond to points c u2032 to d u2032 in the dashed line once the device turns on as the test voltage is increased the tlp current increases and there is a marginal increase in tlp voltage until the device 39 s maximum current handling capability which depends on the size of the device is reached points d to e in the solid line correspond to points d u2032 to e u2032 in the dashed line failure of the clamp occurs at points e and e u2032 for this particular device size region d corresponds the maximum current handling of the structure and hence signifies the tlp current handling of this particular structure this structure was specifically designed to meet 1000v hbm esd rating the tlp current rating required to meet 1000v hbm rating is approximately 0 67 a the size of the fets can be increased decreased to change the tlp current handling and the esd.