are malfunctioning a pogo connector 120 is connected with the probe card 130 for test through a plurality of lower pogo pins 121 the probe card 130 for test includes a plurality of connection terminals 131 to 133 that correspond to the pogo pins 121 respectively the connection terminals 131 to 133 include a contact terminal 131 a resistance 132 and a ground terminal 133 connected to the lower pogo pins 121 respectively accordingly a predetermined resistance ra within an expected range can be provided with respect to each pin if lower and upper pins are under the cause of the malfunction the resistances ra and rb may vary which will be detected through current deviating from an expected range fig5 is a diagram showing a probe card for test according to another embodiment of the present invention referring to fig5 it is possible to make the configuration of the contact terminals 131 to 133 more simply a probe card 130 for test according to another embodiment of the present invention includes a contact terminal 134 that is formed of a conductive film grounded with respect to lower pogo pins the contact terminal 134 formed of the conductive film is connected to the lower pogo pins 121 to.