this fault injection are examined either by direct analysis of the signals or by side channel analysis consumption radiation fig2 is a simplified representation of a usual installation 2 of attack or test of an integrated circuit by means of a laser chip 1 is laid on a support 22 under a microscope 23 the function of the microscope is to determine the location where laser beam f emitted by a laser 25 must hit the chip indeed the dimensions of an integrated circuit are such that nothing is visible to the naked eye and that the sighting should be performed by means of a microscope as compared with the size of the integrated circuit the installation is particularly bulky and in particular does not enable an attack of laser beam f with an incidence perpendicular to the integrated circuit surface further with a conventional bench such as illustrated in fig2 it is not possible to to simultaneously inject several faults in the integrated circuit by means of several laser beams in particular there is not enough room for attacks to be performed with a sufficient accuracy another difficulty is to be able to simultaneously perform attacks on both surfaces of the chip to attack the circuit with several beams it could have been devised to equip the installation with a mirror system bringing the different beams back towards the circuit fig3 is a simplified view of an embodiment of a system of attack or test by laser.