a which can encode the test pattern and send the encoded test pattern to a first analog output system 320 the first analog output system 320 can be coupled to a first analog input system 322 which can facilitate communication of the test pattern to a second analog to digital converter 306 b one should note that the above description provides a way among others to self test an auxiliary input the second analog to digital converter 306 b can convert the test pattern from analog to digital format and can send the test pattern to a second analog decoder 304 b the second analog decoder 304 b can decode the test pattern and send the decoded test pattern to a second frame buffer 308 b the second frame buffer 308 b can send the test pattern to a second digital encoder 312 b which can encode the test pattern and send the encoded test pattern to a vms 460 via an analog output system 352 the vms 460 can analyze the received test pattern to determine whether the analog stt 213 is operating properly the computing device 660 can facilitate this analysis as well as facilitate storage of the analysis at data storage 662 fig1 is a functional flow diagram illustrating an exemplary process for testing at least one.