the beam of visible light to sample plane 200 mirror 239 when pivoted into the optical path directs the reflected light from the sample to mirror 241 transfer optics 245 and 247 direct the reflected light visible to eyepiece 219 by way of mirror 243 further eyepiece 219 may be constructed with appropriate transfer optics so that the microscope may receive dual reflectance observation beams from lamps 225 and 235 which permit simultaneously observing the masking of remote sample image planes 202 and 204 with reflected light the dual reflectance beam permits masking each remote sample image plane to the same shape when the sample is opaque to visible light but transmissive to the radiant energy additionally first lamp 225 can produce an inverse transmissive observation beam using mirrors 227 and 239 simultaneously to view first and second remote sample image planes 202 and 204 and sample plane 200 when the sample is transmissive to visible light the optical path of the microscope is symmetric with respect to the optical path taken by the radiant energy or the visible light with respect to the sample plane 200 thus the microscope of the present invention easily converts from a conventional upright microscope into an inverted microscope as needed to make a particular measurement sample material analysis the preferred embodiment of the present invention uses entirely mirror optics at any place where the visible light and radiant energy share a common optical path for example most visible light transmissive materials used in microscopes are opaque to infrared light and in any event no refracting lens is known that can focus infrared radiant energy and visible light at the same remote sample image plane exact.