tag has been tested the test die sets the good tag register element if the tag is test good the test die then shifts the enable bit to the next tag and the testing repeats until all tags are tested a return line shown at 22 from the last tag die back to the test die 18 provides a return path or a check that all tags have been tested the test die communicates to the tester which dice are good and which are bad and these data are then stored in a database for each lot and wafer only the good dice are chosen from the wafer in a similar embodiment of the invention all tags are enabled for testing and testing commands are sent to all tags the tags perform the tests and store the testing results in a memory element the test die then sequentially shifts the enable bit through each tested tag to determine its status the test die then writes a memory element to signify that the tag was tested and whether it passed or failed the test die then shifts the enable bit to the next tag and the query starts over again this embodiment allows for the parallel testing of tags to reduce testing time this test system differs from prior practice in that typically in the case of any integrated circuit dice not necessarily rf id tags the tester must probe contacts on each individual ic while still on.