one of the wear mechanism stresses 220 230 240 x and represents the probability of bit flip due solely to that wear mechanism in alternate embodiments fewer or more wear mechanisms may be included which would decrease or increase the size of the prob bitflip array respectively also in alternate embodiments prob bitflip accounting can occur at block or superblock logical collection of blocks granularities instead of page granularity in order to simplify the implementation of the design the probability of bit flip due to a given wear mechanism 220 230 240 on a superblock block page is a function given by stress x bitflip f event count acceleration factors deceleration factors eq 1 where the event count tracks the number of times the given stress occurrence happens acceleration factors are those factors that exacerbate the stress due to the given wear mechanism 220 230 240 x and deceleration factors are those factors that reduce the stress due to the given wear mechanism 220 230 240 x the equations that provide each stress xbitflip are detailed below with reference to equations 3 4 and 5 as noted above the exemplary probability of bit flip values shown in the table 200 include a probability component for each of the wear mechanism stresses 220 230 240 stressx bitflip which can be thought of as weighting factors for the overall prob bitflip for example the probability of a bit flip due to program read disturb stress acceleration 220 is 0 024 at block 0 page 0 and is 0 187.