after multiple slits 81 d to 88 d have been formed in the same direction as that of the bus bar of an approximately conical electrode material 100 whose large diameter section is formed with flange portions 81 a to 88 a for installation on an insulator 90 each of the flange portions is coupled with the insulator 90 then the electrode material 100 is cut along extension lines of the slits 81 d to 88 d and thus multiple electrode members electrically isolated from one another are formed application_number US 21637108 A description a method of manufacturing an electrostatic deflector according to an embodiment of the present invention will be described below the electrostatic deflector according to the invention is used in for example the scanning electron microscope shown in fig1 this scanning electron microscope after generating an electron beam 41 from an electron beam generator 11 provided in an upper section of a lens barrel 10 first deflects the electron beam via alignment coils 12 a first deflector and stigmatic coils 13 a second deflector next the scanning electron microscope adjusts a magnification using objective lens coils 14 a magnification controller and scans a sample 21 after this the scanning electron microscope activates a detector 30 to detect an electrically charged particle 42 generated from the sample 21 such as a secondary electron or backscattered electron and displays an.