supports the load of the probe forces coming downward and provides a heat sink for the configurable logic elements 304 the fixture item 102 of fig1 also makes contact with the tester electronics assembly 300 through the aluminum support plate the tester electronics and software configures the configurable logic elements through the performance port shown as item 112 of fig1 during setup probes may be moved and deflected from a first wear pad 308 to a second wear pad 308 when the deflection occurs the configurable logic element 304 which once generated a test pattern or signaling through the first wear pad may be configured to generate test patterns and signaling through the second wear pad the configurable logic element would be reconfigured using software in the tester electronics as a result using the method and apparatus of the present invention mechanical realignments may be performed using the adaptor assembly and software reconfiguration to support the mechanical realignment may be accomplished using the test electronics assembly 300 in combination with the tester electronics e g 104 of fig1 a planar view of an array of configurable logic units e g item 302 of fig3 is shown as item 400 in one embodiment of the.