the correlation wafer that was identified by the mes 22 the tester server 26 then transmits the test programs to the tester 28 step f does not have to be performed in sequence with any of steps b c d and e thus step f can be performed before concurrently with or after any of these steps in step g the tester 28 collects the reference data testing instructions and test programs for the correlation wafer and executes the testing instructions which are the position information of the dice that are to be tested the tester 28 then transmits signals to the prober 10 to test the correlation wafer in step h the prober physically makes electrical contact with the dice one die at a time or several dice at once on the correlation wafer to test the functionality of the dice as the prober 10 tests the dice on the correlation wafer it sends the results back to the tester server 26 for storage after the testing is completed the tester 28 in step i may send a request to the central instruction subsystem 90 for the correlation criteria in step j the correlation server 32 may identify within the database 40 the requested correlation criteria and in step k transmit the correlation criteria to the tester 28 the correlation criteria may be.