determining the location of a droplet of liquid placed on a surface of a semiconductor wafer in one embodiment the method includes establishing first and second reference axes that intersect at a point and superimposing the point over the droplet on the semiconductor wafer surface a first reference coordinate indicative of the position of the point along the first axis and a second reference coordinate indicative of the position of the point along the second axis are generated application_number US 37330503 A description referring now to the drawings for the purposes of illustrating the present preferred embodiments of the invention only and not for the purposes of limiting the same fig1 4 show a preferred location device 10 for supporting a component such as a silicon wafer 12 thereon although the subject invention is particularly well suited for use in connection with silicon semiconductor wafers the skilled artisan will readily appreciate that the subject invention could be easily adapted for use in connection with a variety of other types of articles and components without departing from the spirit and scope of the present invention as can be seen in fig1 and 2 the location device 10 preferably comprises a base 16 that movably supports a component or wafer carriage 40 and a transparent locator plate 60 in a preferred form the base 16 includes two side members 18 fabricated from stainless steel or other suitable material a pair of spaced rods 20 are attached to the side members 18 and extend therebetween as will be discussed in further detail below rods 20 define a first plane along which the component carriage 40 can be selectively positioned the linear directions in which the component carriage 40.