element iso_ 2 may be turned off soft errors occur when a current flows due to a cosmic ray through the second nmos transistor n 2 that is turned off however even though current flows through the second nmos transistor n 2 since the second nmos transistor n 2 is electrically separated from the node a by the second separation element iso_ 2 the voltage of the node a does not vary accordingly no change may occur in the data stored in the latch circuit that is even though leakage current flows through the second nmos transistor n 2 since the second separation element iso_ 2 substantially prevents a change in the data due to leakage current a soft error may be avoided referring to fig3 b when u2018 l u2019 data is stored in the node a of the latch circuit i e the second node b has a logic high level u2018 h u2019 the first pmos transistor p 1 the second nmos transistor n 2 and the second separation element iso_ 2 may be turned on the first nmos transistor n 1 the second pmos transistor p 2 and the first separation element iso_ 1 may be turned off the soft error occurs when a current flows due to a cosmic ray through the first nmos transistor n 1 that is to be turned off however even though current flows through the first nmos transistor n 1 since the first nmos transistor n 1 is electrically separated from the node b by the first separation element iso_ 1.