Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP2S6.Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning probe microscopy (SPM) is a challenging task, typically requiring extensive and laborious human supervision.  In this work, we realize automated ROI tracking in piezoresponse force microscopy (PFM) during a fast (≈0.8°C/s) thermally stimulated ferroelectric-to-paraelectric phase transition in CuInP2S6. 
THERM