The X-ray diffraction (XRD), photoluminescence (PL), and field emission scanning electron microscope (FESEM) are used to examine changes in the nanowires.  XRD results show that the crystallite size first decreases and then increases with high ion dose while peaks' intensity decreases continuously with increasing the dose. 
XRD
Defect-mediated photoluminescence enhancement in ZnO/ITO via MeV Cu++ ion irradiation.Zinc oxide (ZnO) nanowires play a pivotal role in the nanoworld due to their broad range of characteristics and applications.  The X-ray diffraction (XRD), photoluminescence (PL), and field emission scanning electron microscope (FESEM) are used to examine changes in the nanowires.  The absence of (102) plane after irradiation depicts the defects formation.  The PL spectra indicate the strong near-band edge peak and green luminescence enhancement has been recorded due to low dose ion irradiation.
PL
The X-ray diffraction (XRD), photoluminescence (PL), and field emission scanning electron microscope (FESEM) are used to examine changes in the nanowires.  FESEM clearly shows the damage that occurred in the density of nanowires and also depicts the reduced charging effect with increasing dose. 
FESEM