Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. 
THERM
Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. 
THERM
Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. 
THERM
Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. 
THERM
Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. 
THERM