X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were also conducted for microstructure characterization. 
X-ray diffraction
X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were also conducted for microstructure characterization. 
scanning electron microscopy
X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were also conducted for microstructure characterization. 
transmission electron microscopy