The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
XRD
The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
BET
The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
SEM
The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
TEM
The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
XPS
The prepared samples were characterized by multiple techniques including X-ray diffraction (XRD), Brunauer-Emmett-Teller (BET) surface area, scanning electronic microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and UV-vis diffuse-reflectance spectroscopy (UV-vis DRS). 
UV-vis DRS