In this work, we combined Ar ion milling under non-atmospheric conditions with in situ cross-sectional Kelvin probe force microscopy (KPFM) for direct imaging of the internal electrical potential distribution of the SS-LIBs. 
KPFM
In this work, we combined Ar ion milling under non-atmospheric conditions with in situ cross-sectional Kelvin probe force microscopy (KPFM) for direct imaging of the internal electrical potential distribution of the SS-LIBs. 
Ar ion milling