"Multipoint Force Feedback" 
Multipoint Force Feedback
Leveling of Massively Parallel Tip Arrays in Scanning Probe Lithography.Nanoscale patterning with massively parallel 2D array tips is of significant interest in scanning probe lithography.  The position sensitive leveling operates in a fully automated manner and is applicable to recently developed scanning probe lithography techniques of various kinds which can enable "desktop nanofabrication."
Scanning Probe Lithography
Here, polymer pen lithography is demonstrated with a novel leveling method to account for the magnitude and direction of the total applied force of tip arrays by a multipoint force sensing structure integrated into the tip holder. 
Polymer Pen Lithography