In this chapter, we describe a simple high-resolution technique, scanning angle interference microscopy (SAIM), for the imaging and localization of fluorescent molecules with nanometer precision along the optical axis.  In SAIM, samples above a reflective surface are sequentially scanned with an excitation laser at varying angles of incidence.  SAIM is easily implemented on widely available commercial total internal reflection fluorescence microscopes, offering potential for widespread use in cell biology.  Here, we describe the setup of SAIM and its application for imaging cellular structures near (<1 μm) the sample substrate.
SAIM
SAIM is easily implemented on widely available commercial total internal reflection fluorescence microscopes, offering potential for widespread use in cell biology. 
total internal reflection fluorescence microscopes