To evaluate the relationship between retinal microstructure and central visual field sensitivity (CVFS) after vitrectomy with internal limiting membrane (ILM) peeling for epiretinal membrane (ERM) using swept-source (SS) OCT and Humphrey Field Analyzer (HFA) (Zeiss, Dublin, CA) 10-2 program.



Humphrey Field Analyzer (HFA)
To evaluate the relationship between retinal microstructure and central visual field sensitivity (CVFS) after vitrectomy with internal limiting membrane (ILM) peeling for epiretinal membrane (ERM) using swept-source (SS) OCT and Humphrey Field Analyzer (HFA) (Zeiss, Dublin, CA) 10-2 program.



Zeiss
To evaluate the relationship between retinal microstructure and central visual field sensitivity (CVFS) after vitrectomy with internal limiting membrane (ILM) peeling for epiretinal membrane (ERM) using swept-source (SS) OCT and Humphrey Field Analyzer (HFA) (Zeiss, Dublin, CA) 10-2 program.



swept-source (SS) OCT