The Epitaxial Growth of Self-Assembled Ternaphthalene Fibers on Muscovite Mica.The morphology and structure of 2,2':6',2″-ternaphthalene (NNN) deposited on muscovite mica(001) substrates was investigated by scanning force microscopy (SFM) and specular X-ray diffraction measurements.  Based on XRD-PF and SFM analysis, the azimuthal alignment of {001} orientated crystallites is explained by ledge-directed epitaxy along the fibers' sidewalls. 
SFM
The Epitaxial Growth of Self-Assembled Ternaphthalene Fibers on Muscovite Mica.The morphology and structure of 2,2':6',2″-ternaphthalene (NNN) deposited on muscovite mica(001) substrates was investigated by scanning force microscopy (SFM) and specular X-ray diffraction measurements. 
X-ray diffraction measurements
Both orientations are characterized by a well-defined azimuthal alignment relative to the substrate surface, which is analyzed by X-ray diffraction pole figure (XRD-PF) measurements.  Based on XRD-PF and SFM analysis, the azimuthal alignment of {001} orientated crystallites is explained by ledge-directed epitaxy along the fibers' sidewalls. 
XRD-PF
The experimental findings are confirmed by force-field simulations and are discussed based on a recently reported growth model.
force-field simulations